Analog-to-digital converter (ADC)

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A 500 MS/s Robust 2b/cycle Pipelined-SAR ADC Achieving 64.6-dB SNDR and 82.6-dB SFDR With Linearity Enhancement Techniques

A 500 MS/s Robust 2b/cycle Pipelined-SAR ADC Achieving 64.6-dB SNDR and 82.6-dB SFDR With Linearity Enhancement Techniques 150 150
Author(s): Qiang Yu, Zheng Zhu, Lulu Zhang, Qin Huang, Yao Feng, Chao Liang, Biao Hu, Ling Du, Rongbin Yang, Shuangyi Wu, Qiang Li

Abstract:

This letter presents a 14-bit 500-MS/s 3-stage pipelined successive-approximation-register (SAR) analog-to-digital converter (ADC). By exploiting robust 2b/cycle SAR ADCs, this ADC incorporates significant voltage and time redundancy. High SFDR is achieved through several linearity enhancement techniques. First, a DAC splitting technique addresses the common-mode voltage matching problem between …

Published in: IEEE Solid-State Circuits Letters
Page(s): 1 – 1
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3639322
Publisher: IEEE

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A Calibration-Free Pipelined-SAR ADC With Cross-Stage Gain-Mismatch Error Shaping and Inherent Noise Shaping

A Calibration-Free Pipelined-SAR ADC With Cross-Stage Gain-Mismatch Error Shaping and Inherent Noise Shaping 150 150
Author(s): Jihang Gao, Yaohui Luan, Siyuan Ye, Jiajia Cui, Xinhang Xu, Linxiao Shen

Abstract:

This article presents a calibration-free pipelined-successive-approximation-register (SAR) analog-to-digital converter (ADC) based on the proposed cross-stage gain-mismatch-error shaping (CS-GMES) mechanism. The CS-GMES is realized by including the entire 2nd stage into MES operation to unify the gain error and the 2nd-stage mismatch error. A feedback capacitor provides cross-stage connection and mismatch …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3624412
Publisher: IEEE

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A “No Gain” Direct-Conversion IQ RF-to-Bits Receiver Without Active Linear Amplification

A “No Gain” Direct-Conversion IQ RF-to-Bits Receiver Without Active Linear Amplification 150 150
Author(s): Jeroen Ponte, Roel Plompen, Emiel Zijlma, Eric A. M. Klumperink, Harijot Singh Bindra, Bram Nauta

Abstract:

This work describes a direct-conversion IQ receiver (RX) that does not utilize any active linear (power) amplification, covering its design considerations, prototype implementation, and measurement verification. Only RLC components, MOS transistor (MOST) switches, and comparators are used, leading to several unique design challenges. Key among these are the fact that …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 17
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3611114
Publisher: IEEE

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An 8-Bit 400-MS/s 1-Then-2-Bit/Cycle SAR ADC With Comparator Rotation-Based Input-Independent Background Offset Calibration

An 8-Bit 400-MS/s 1-Then-2-Bit/Cycle SAR ADC With Comparator Rotation-Based Input-Independent Background Offset Calibration 150 150
Author(s): Changjoo Kim, Sooho Park, Yohan Choi, Minkyun Shim, Woojin Lee, Donghwi Seo, Chulwoo Kim

Abstract:

This letter presents an 8-bit 400 MS/s 1-then-2-bit/cycle successive approximation register (SAR) analog-to-digital converter (ADC) employing a comparator rotation-based background offset calibration (CRBC) technique. Unlike conventional 1-then-2-bit/cycle architectures, where calibration validity depends on the input voltage, the proposed comparator rotation-based background calibration enables input-independent background calibration, …

Published in: IEEE Solid-State Circuits Letters
Page(s): 345 – 348
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3624263
Publisher: IEEE

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A Benchmark of Cryo-CMOS Dynamic Comparators in a 40 nm Bulk CMOS Technology

A Benchmark of Cryo-CMOS Dynamic Comparators in a 40 nm Bulk CMOS Technology 150 150
Author(s): Bram Veraverbeke, Filip Tavernier

Abstract:

All cryo-CMOS quantum-classical control interfaces require an analog-to-digital converter (ADC) bridging the analog qubits and the digital control logic. Dynamic comparators play a crucial role in the precision, speed, and power consumption of these ADCs. Yet, their performance is severely impacted by the cryogenic environment. Therefore, this letter benchmarks, for …

Published in: IEEE Solid-State Circuits Letters
Page(s): 317 – 320
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3618161
Publisher: IEEE

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A 6.2b-ENOB 2.5 GS/s Flash-and-VCO-Based Subranging ADC Using a Residue Shifting Technique

A 6.2b-ENOB 2.5 GS/s Flash-and-VCO-Based Subranging ADC Using a Residue Shifting Technique 150 150
Author(s): Sungjin Kim, Jeonghyun Lee, Yoonse Cho, Jintae Kim, Jaehyouk Choi, Heein Yoon

Abstract:

This letter presents a 7-bit pipelined subranging ADC that integrates a 3-bit flash ADC with a ring VCO-based quantizer. A resistor-ladder-based residue shifter (RLRS) replaces traditional residue amplifiers, efficiently shifting the residue voltage into the most linear region of the $K_{textrm {VCO}}$ , thereby eliminating the need for post-linearity calibration. …

Published in: IEEE Solid-State Circuits Letters
Page(s): 177 – 180
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3578546
Publisher: IEEE

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