Resistors

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Smart Write Algorithm to Enhance Performances and Reliability of an RRAM Macro

Smart Write Algorithm to Enhance Performances and Reliability of an RRAM Macro 150 150
Author(s): Bastien Giraud, Sebastien Ricavy, Cyrille Laffond, Ilan Sever, Valentin Gherman, Florent Lepin, Mariam Diallo, Khadija Zenati, Sylvain Dumas, Olivier Guille, Maxim Vershkov, Alessandro Bricalli, Giuseppe Piccolboni, Jean-Philippe Noel, Anass Samir, Gaël Pillonnet, Yvain Thonnart, Gabriel Molas

Abstract:

This article presents a comprehensive assessment of the impact of various design assist techniques on the inherent performance and reliability of native resistive RAM (RRAM) on silicon. The collaborative optimization of design and technology plays a crucial role in replacing conventional flash memory as the leading solution. We showcase that …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2024
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2024.3386429
Publisher: IEEE

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A 300- $\mu$ W 2.4-GHz PVT-Insensitive Subthreshold Reference-Based LNA

A 300- $\mu$ W 2.4-GHz PVT-Insensitive Subthreshold Reference-Based LNA 150 150
Author(s): Martin Lee, Motaz Mohamed Elbadry, Kambiz Moez

Abstract:

This article introduces a novel ultra-low-power reference-based low-noise amplifier (LNA) designed to reduce performance variations due to process, voltage, and temperature (PVT) when operating in the subthreshold region. The LNA is embedded within a reference circuit that directly controls the performance of the LNA over PVT variations. By combining the …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 14
Year of Publication: 2024
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2024.3375154
Publisher: IEEE

View on IEEE Xplore

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