Nonvolatile memory

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Sensing- and Periphery-Aware Modeling of a Hybrid MTJ–CMOS Nonvolatile 1-bit Sign-Weight Memory Subsystem for Energy-Constrained Edge Inference

Sensing- and Periphery-Aware Modeling of a Hybrid MTJ–CMOS Nonvolatile 1-bit Sign-Weight Memory Subsystem for Energy-Constrained Edge Inference 150 150
Author(s): Byeong-Gwon Kim, Byeong-Kwon Ju, Ki-Young Lee

Abstract:

The spin-transfer-torque magnetic random access memory (STT-MRAM) is attractive for nonvolatile 1-bit sign-weight storage, but a favorable cell or local-read metric does not establish subsystem efficiency. We analyze a hybrid magnetic tunnel junction (MTJ)–complementary metal–oxide–semiconductor (CMOS) memory subsystem, in which MTJs store static signs while sensing, reference …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 192 – 198
Year of Publication: 2026
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2026.3726699
Publisher: IEEE

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Merged-Reference-Compatible Offset-Canceling Discharge-Based Sensing Circuit for STT-MRAM in 28-nm CMOS

Merged-Reference-Compatible Offset-Canceling Discharge-Based Sensing Circuit for STT-MRAM in 28-nm CMOS 150 150
Author(s): Jaeyong Jang, Mingu Han, Jaehwan Kim, Taehui Na

Abstract:

This article proposes an offset-canceling (OC) discharge-based sensing circuit (OCDC) for spin-transfer-torque magnetic random access memory (STT-MRAM). The proposed circuit simultaneously implements a merged reference line (MRL) architecture and threshold voltage ( $\mathbf {V}_{\mathbf {TH}}$ ) mismatch cancellation, resolving the structural incompatibility between the conventional OC schemes and MRL. A diode-connection-based, …

Published in: IEEE Solid-State Circuits Letters
Page(s): 210 – 213
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3715234
Publisher: IEEE

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FeFET-Based CMOS Current Starvation Programmable Delay Element

FeFET-Based CMOS Current Starvation Programmable Delay Element 150 150
Author(s): Albi Mema, Simon Thomann, Hussam Amrouch

Abstract:

Programmable delay elements (PDEs) are crucial circuit building blocks that enable precise timing adjustments of signal transitions. They are used in various critical applications, like time-to-digital converters. They are often used to mitigate aging by clock skew tuning postfabrication. However, typical CMOS PDE designs require many transistors while still offering …

Published in: IEEE Solid-State Circuits Letters
Page(s): 166 – 169
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3692304
Publisher: IEEE

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A 14-nm Nonvolatile-Volatile-Fused Compute-In-Memory Macro Based on Logic-Compatible Flash for Plastic Neural Networks

A 14-nm Nonvolatile-Volatile-Fused Compute-In-Memory Macro Based on Logic-Compatible Flash for Plastic Neural Networks 150 150
Author(s): Weizeng Li, Linfang Wang, Zhidao Zhou, Zhi Li, Wang Ye, Junyu Zhu, Junzhe Shen, Bohan Wang, Hanghang Gao, Hongyang Hu, Jing Liu, Jinshan Yue, Jianguo Yang, Qing Luo, Qi Liu, Chunmeng Dou, Yang Chai, Ming Liu

Abstract:

Designing computing-in-memory (CIM) chips with synaptic plasticity can potentially support energy-efficient on-chip learning in edge devices for rapid local task adaptation. Its silicon implementation is challenging as it requires hybridizing nonvolatile and volatile memory (VM) and customized computational operations. In this work, we propose a plastic CIM (P-CIM) macro featuring: 1) …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3652940
Publisher: IEEE

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Coupled Simulation Methodology for In-Memory Computing Systems

Coupled Simulation Methodology for In-Memory Computing Systems 150 150
Author(s): Daniel Schön, Christian Owusu-Afriyie, Quang Huy Nguyen, Rainer Leupers, Stephan Menzel, Melvin Galicia

Abstract:

Simulations for the development and optimization of future in-memory computing (IMC) systems often face the problem that the modeling of the large system is desired, but at the same time, the effects at the device level should also be taken into account. Such effects could be due to the material …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 18 – 26
Year of Publication: 2026
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2026.3652426
Publisher: IEEE

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A Multicore Programmable Variable-Precision Near-Memory Accelerator for CNN and Transformer Models

A Multicore Programmable Variable-Precision Near-Memory Accelerator for CNN and Transformer Models 150 150
Author(s): Yiming Yang, Yiyang Yuan, Xinghua Wang, Xiaoran Li, Hao Wu, Qihao Liu, Weiye Tang, Xiangqu Fu, Feng Zhang

Abstract:

Convolutional neural network (CNN) and transformer are the most popular neural network models in computer vision (CV) and natural language processing (NLP). It is quite common to use both these two models in multimodal scenarios, such as text-to-image generation. However, these two models have very different memory mappings, dataflows and …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3624011
Publisher: IEEE

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Energy-Efficient Logic-in-Memory and Neuromorphic Computing in Raised Source and Drain MOSFETs

Energy-Efficient Logic-in-Memory and Neuromorphic Computing in Raised Source and Drain MOSFETs 150 150
Author(s): Md. Hasan Raza Ansari, Bashayr Alqahtani, Naveen Kumar, Vihar Georgiev, Nazek El-Atab

Abstract:

This work highlights the potential application of raised source and drain (RSD) MOSFETs-based charge trapping memory (CTM) for next-generation computing applications. This simulation study presents a double-gate (DG)-RSD MOSFET technology with a short gate length (50 nm) to significantly improve the performance of logic-in-memory (LIM) and neuromorphic computing (NC) systems. …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 197 – 204
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3630217
Publisher: IEEE

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Understanding Reliability Trade-Offs in 1T-nC and 2T-nC FeRAM Designs

Understanding Reliability Trade-Offs in 1T-nC and 2T-nC FeRAM Designs 150 150
Author(s): Sadik Yasir Tauki, Rudra Biswas, Rakesh Acharya, Jiahui Duan, Rajiv Joshi, Kai Ni, Vijaykrishnan Narayanan

Abstract:

Ferroelectric random access memory (FeRAM) is a promising candidate for energy-efficient nonvolatile memory, particularly for logic-in-memory and compute-in-memory (CIM) applications. Among the available cell architectures, One-Transistor–n-Capacitor (1T-nC) and two-transistor–n-capacitor (2T-nC) FeRAMs each offer distinct trade-offs in density, scalability, and reliability. In this work, we present a comparative study …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 148 – 156
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3619908
Publisher: IEEE

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Benchmarking of FERAM-Based Memory System by Optimizing Ferroelectric Device Model

Benchmarking of FERAM-Based Memory System by Optimizing Ferroelectric Device Model 150 150
Author(s): Mohammad Adnaan, Saeideh Alinezhad Chamazcoti, Emil Karimov, Marie Garcia Bardon, Francky Catthoor, Jan van Houdt, Azad Naeemi

Abstract:

We present a framework for design technology co-optimization (DTCO) of the main memory system with one transistor-one capacitor (1T1C) ferroelectric random access memory (FERAM) as an alternative to dynamic random access memory (DRAM). We start with the ferroelectric capacitor device model and perform array-level memory circuit simulation. Then, we …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 99 – 106
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3618883
Publisher: IEEE

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