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A Sub-Threshold Oscillator-Based High-Accuracy Temperature Sensor With Tolerance to Supply Fluctuation and Device Aging

A Sub-Threshold Oscillator-Based High-Accuracy Temperature Sensor With Tolerance to Supply Fluctuation and Device Aging 150 150
Author(s): Wei Wang, Yumin Su, Shayok Dutta, Liwen Jiang, Zhiyu Chen, Zhanghao Yu, Caleb Kemere, Kaiyuan Yang

Abstract:

Accurate, low-power, and compact temperature sensors are demanded in a wide range of biomedical, environmental, and industrial sensing applications. This article presents an accurate and precise CMOS temperature sensor based on a sub-threshold ring oscillator (RO) in 180 nm. The sensing core employs a five-stage super cut-off contention-free (SCCF) delay cell …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 11
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3644747
Publisher: IEEE

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Actiniaria: Distributed Dynamic-IR-Drop-Aware Timing Monitor for AVFS With Lightweight Tentacles

Actiniaria: Distributed Dynamic-IR-Drop-Aware Timing Monitor for AVFS With Lightweight Tentacles 150 150
Author(s): Junyi Qian, Lishuo Deng, Cai Li, Yizhi Ding, Weiwei Shan

Abstract:

Advances in integrated circuit (IC) technology have amplified the effects of process, voltage, and temperature (PVT) variations, particularly dynamic IR drop, which severely affects timing. Post-silicon IR drop monitoring circuits are lacking, forcing designers to reserve substantial static guard bands for worst-case scenarios, compromising energy efficiency. Inspired by biomimetics, this …

Published in: IEEE Solid-State Circuits Letters
Page(s): 25 – 28
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3645701
Publisher: IEEE

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A 28-Gb/mm2 4XX-Layer 1-Tb 3-b/Cell WF-Bonding 3D-nand Flash With 5.6-Gb/s/Pin IOs

A 28-Gb/mm2 4XX-Layer 1-Tb 3-b/Cell WF-Bonding 3D-nand Flash With 5.6-Gb/s/Pin IOs 150 150
Author(s): Sang-Soo Park, Jae-Doeg Lyu, Myungjun Kim, Jaeyun Lee, Youngsun Song, Chung-Ho Yu, Hirano Makoto, Yongseok Kwon, Jong-Hoon Park, Ho-Joon Kim, Daein Lee, Donghyun Seo, Philkyu Kang, Byungrok Go, Minseok Kim, Seoyoon Jeon, Jaehwan Ryu, Jungmin Seo, Hwan-Seok Ku, Youngmin Jo, Doo-Hyun Kim, Hyunjun Yoon, Wontae Kim, Inmo Kim, Sunghoon Kim, Jiho Cho, Moosung Kim, Jae-Woo Im, Jongmin Park, Youngdon Choi, Il-Han Park, Chiweon Yoon, Hyunsuk Kim, Jaehoon Jang, Seungjae Lee, Ki-Whan Song, Sung-Hoi Hur

Abstract:

The challenge of evolving to create a memory that is shrinking compared to the previous generation while satisfying the high performance and low power required for flash memory has been present in every generation, but the recent rapid change to artificial intelligence (AI) trends is very tough, as the level …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 9
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3613774
Publisher: IEEE

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An 800GbE PAM-4 PHY Transceiver for 42 dB Copper and Direct-Drive Optical Applications in 7 nm

An 800GbE PAM-4 PHY Transceiver for 42 dB Copper and Direct-Drive Optical Applications in 7 nm 150 150
Author(s): Chang Liu, Burak Catli, Yong Liu, Anand Vasani, Guansheng Li, Kun Chuai, Lakshmi Rao, Yang Liu, Xin Meng, Jiawen Zhang, Tim He, Batu Dayanik, Vadim Milirud, Meisam Honarvar Nazari, Hyo Gyuem Rhew, Derui Kong, Arvindh Iyer, Nan Wang, Alireza Nilchi, Aminghasem Safarian, Ray Wang, Hyung-Joon Jeon, Xiaochen Yang, Boyu Hu, Jerry Han, Adesh Garg, Kumar Thasari, Heng Zhang, Namik Kocaman, Ali Nazemi, Delong Cui, Afshin Momtaz, Jun Cao

Abstract:

This work presents a low power DSP-based single-chip 800GbE PAM-4 PHY transceiver in 7 nm process capable of driving eight lanes of up to 112-Gb/s. It supports both electrical and optical links with monolithic integrated laser driver enabling direct-drive PAM-4 output capability for EML and silicon photonics. The transceiver supports 42 …

Published in: IEEE Solid-State Circuits Letters
Page(s): 281 – 284
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3608134
Publisher: IEEE

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A High-Density Low-Leakage and Low-Power Fully Voltage-Stacked SRAM for IoT Application

A High-Density Low-Leakage and Low-Power Fully Voltage-Stacked SRAM for IoT Application 150 150
Author(s): Sekeon Kim, Giseok Kim, Kyeongrim Baek, Keonhee Cho, Hyunjun Kim, Yeonho Jung, Dongwook Seo, Sangyeop Baeck, Sungjae Lee, Seong-Ook Jung

Abstract:

The general approach to suppress leakage in static random access memory (SRAM) is to use a low voltage ( $V_{text {L}}$ ), generated by a low-dropout regulator (LDO), as the cell supply voltage (CVDD) of SRAM array in the standby mode. However, the effectiveness of lowering CVDD is constrained by the …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 12
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3582974
Publisher: IEEE

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Reconfigurable Ferroelectric Bandpass Filter With Low-Frequency Noise Analysis for Intracardiac Electrogram Monitoring

Reconfigurable Ferroelectric Bandpass Filter With Low-Frequency Noise Analysis for Intracardiac Electrogram Monitoring 150 150
Author(s): Jianwei Jia, Zhenge Jia, Omkar Phadke, Yiyu Shi, Shimeng Yu

Abstract:

Implantable cardioverter defibrillators (ICDs) provide real-time monitoring and immediate defibrillation for life-threatening arrhythmias. However, the intracardiac electrogram (IEGM) acquisition of ICDs faces stringent constraints, including power consumption, low-frequency noise, and patient-specific physiological variability. This article introduces an ultralow-power, high-resolution, reconfigurable three-stage bandpass filter designed specifically for IEGM, utilizing ferroelectric field-effect …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 67 – 73
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3584711
Publisher: IEEE

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A 9-GHz Low-In-Band Noise Sub-Sampling-Chopper PLL With Charge-Share Canceling Technique

A 9-GHz Low-In-Band Noise Sub-Sampling-Chopper PLL With Charge-Share Canceling Technique 150 150
Author(s): Xiangjian Kong, Kai Xu, Huanlin Xie, Mingchao Jian, Hao Lian, Robert Bogdan Staszewski, Chunbing Guo

Abstract:

This article presents a low-jitter sub-sampling chopper phase-locked loop (SS-CPLL) that incorporates a novel chopping charge pump (C-CP) to mitigate 1/f noise in short-channel devices operating at a low supply voltage of 0.75 V. A charge-share cancellation technique is introduced to suppress ripple generated by residual charge from the previous reference …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1384 – 1396
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3532504
Publisher: IEEE

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A 430- μ A 68.2-dB-SNR 133-dBSPL-AOP CMOS-MEMS Digital Microphone Based on Electrostatic Force Feedback Control

A 430- μ A 68.2-dB-SNR 133-dBSPL-AOP CMOS-MEMS Digital Microphone Based on Electrostatic Force Feedback Control 150 150
Author(s): Jiaqi Dong, Qi Zhang, Xinwen Zhang, Yekan Chen, Yili Shen, Bo Zhao, Yuxuan Luo

Abstract:

This article introduces a high-acoustic-dynamic-range and low-power digital microphone based on the electrostatic force feedback control (EFFC). The proposed design adjusts the sensitivity of the micro-electro-mechanical system (MEMS) by adaptively biasing it at different input amplitudes, thereby extending the dynamic range (DR). The proposed adaptive biasing technique allows the induced …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1199 – 1209
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3531509
Publisher: IEEE

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A 76.9 ppm/K Nano-Watt PVT-Insensitive CMOS Voltage Reference Operating From 4 to 300 K for Integrated Cryogenic Quantum Interface

A 76.9 ppm/K Nano-Watt PVT-Insensitive CMOS Voltage Reference Operating From 4 to 300 K for Integrated Cryogenic Quantum Interface 150 150
Author(s): Jing Wang, Jun He, Man-Kay Law, Xinzhe Wang, Futian Liang, Lin Cheng

Abstract:

This work proposes a temperature and process-compensated low-power Cryo-CMOS voltage reference without trimming for quantum integrated interface, which is capable of operating continuously from room temperature (RT) down to cryogenic temperatures. By compensating for the main accuracy limiting factors including the process dependence of the transistor threshold voltage, device mismatch …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 3242 – 3256
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3530472
Publisher: IEEE

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