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A Three-Level Dual-Path Hybrid Buck Converter With Mitigated Capacitive Current and Seamless DVS Across a Wide Output Voltage Range

A Three-Level Dual-Path Hybrid Buck Converter With Mitigated Capacitive Current and Seamless DVS Across a Wide Output Voltage Range 150 150
Author(s): Jae-Hyun Kim, Jun-Gi Lee, Hyunki Han, Hyun-Sik Kim

Abstract:

This article presents a three-level dual-path (TLDP) buck converter tailored for mobile application processors (APs) with a 1.8-V input and 0.4–1.5-V output range. Conventional buck (CB) and multi-level buck (MLB) converters suffer from prohibitive DC resistance ( $R_{\mathrm {DCR}}$ ) losses in compact inductors as load current increases. Although various multi-path …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 15
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3710310
Publisher: IEEE

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Building Minimum-Power Digital Circuits With Sub-Femtowatt Dynamic Leakage-Suppression Logic Standard Cells

Building Minimum-Power Digital Circuits With Sub-Femtowatt Dynamic Leakage-Suppression Logic Standard Cells 150 150
Author(s): Daniel S. Truesdell, Jacob Breiholz, Benton H. Calhoun

Abstract:

This article investigates dynamic leakage-suppression (DLS) logic for minimum-power operation in digital circuits. The DLS logic family uses a strong intrinsic subthreshold leakage reduction technique and is an emerging approach for computing applications that prioritize low active power at or beneath the nW-level. We analytically model the key operating characteristics …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 15
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3709741
Publisher: IEEE

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A 0.1514-pJ/bit 18-Gb/s/wire Run-Length-Tolerant Transition-Driven AC-Coupled Transceiver for Die-to-Die Interfaces

A 0.1514-pJ/bit 18-Gb/s/wire Run-Length-Tolerant Transition-Driven AC-Coupled Transceiver for Die-to-Die Interfaces 150 150
Author(s): Jun-Cheol Lee, Joo-Hyung Chae

Abstract:

This article presents a transition-driven AC-coupled transceiver (TRX) optimized for low-power and compact die-to-die (D2D) interfaces. To address the limitations of conventional PMOS- and transimpedance-amplifier (TIA)-based receivers (RXs), the proposed RX architecture employs a small 130-fF coupling capacitor to capture only transition information, eliminating the need for bulky …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 12
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3708634
Publisher: IEEE

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A 27-Gb/s/pin Inverter-Based Delay-Matched PAM-3 Transceiver With Pattern-Selective Switching Jitter Compensation for Die-to-Die Interfaces

A 27-Gb/s/pin Inverter-Based Delay-Matched PAM-3 Transceiver With Pattern-Selective Switching Jitter Compensation for Die-to-Die Interfaces 150 150
Author(s): Changmin Sim, Seongcheol Kim, Seungwoo Park, Junseob So, Hwaseok Shin, Taehwan Kim, Seon-Been Lee, Minkyun Shim, Chulwoo Kim

Abstract:

This article presents a 27-Gb/s/pin inverter-based delay-matched three-level pulse amplitude modulation (PAM-3) transceiver for short-reach die-to-die (D2D) interfaces. The proposed design uses two parallel, identical offset-programmable transimpedance amplifiers (TIAs) to independently generate two finely tunable PAM-3 reference levels with minimal parasitic loading, enabling multi-level signaling within a …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 17
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3706449
Publisher: IEEE

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A −248-dB FOMref CS-Fusion PLL Architecture Combining the Advantages of PFD-CP PLLs and Sampling PLLs in a Single Loop

A −248-dB FOMref CS-Fusion PLL Architecture Combining the Advantages of PFD-CP PLLs and Sampling PLLs in a Single Loop 150 150
Author(s): Junyuan Su, Yuxuan Hu, Zherui Zhang, Lei Wang, Yuncai Zhuang, Fei Song, Jiayoon Ru

Abstract:

This article introduces a CP-sampling (CS)-fusion PLL architecture that combines the advantages of PFD-CP PLLs (robust and speedy locking) and sampling PLLs (low jitter/power) in a single loop. The PFD sends pulsewidth-modulation (PWM) pulses to a merged $mathbf {G_{m}}$ /CP (GCP) block so that the phase error …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 20
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3704989
Publisher: IEEE

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A Bio-Impedance Readout IC With Phase-Locked Sampling for Real-Time Electrical Impedance Spectroscopy

A Bio-Impedance Readout IC With Phase-Locked Sampling for Real-Time Electrical Impedance Spectroscopy 150 150
Author(s): Seonghyun Park, Song-I Cheon, Haidam Choi, Sein Oh, Sohmyung Ha, Minkyu Je

Abstract:

This article presents an electrical bio-impedance (bioZ) spectroscopy integrated circuit (IC) that achieves both high-throughput and high-accuracy. The proposed phase-locked sampling (PLS) scheme, which employs a sampling phase-locked loop (SPLL) and a reference resistor ( $R_{\textit {REF}}$ ), enables fast and precise impedance demodulation. By extracting the impedance components through sampling …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 14
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3704052
Publisher: IEEE

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A Capacitor-Free Hybrid-Process Low Dropout Regulator With Ultrahigh-Gain Amplifier and Super Source Follower for 0.297 mV/A Load Regulation and 0.024 mV/V Line Regulation

A Capacitor-Free Hybrid-Process Low Dropout Regulator With Ultrahigh-Gain Amplifier and Super Source Follower for 0.297 mV/A Load Regulation and 0.024 mV/V Line Regulation 150 150
Author(s): Yu-Ting Huang, Xiao-Quan Wu, Chi-Yu Chen, Po-Jui Chiu, Chien-Wei Cho, Tz-Wun Wang, Ke-Horng Chen, Ying-Hsi Lin, Shian-Ru Lin, Tsung-Yen Tsai, Sheng-Hsi Hung, Chih-Fang Huang, Philex Ming-Yan Fan, Tsorng-Juu Liang, Hann-Huei Tsai

Abstract:

The proposed capacitor-free hybrid-process low-dropout regulator (LDO) achieves 900-mA maximum current capacity and 99.99% peak current efficiency with 90 $\mu $ A quiescent current. By combining GaN and silicon processes, the proposed Ultrahigh gain amplifier (UHGA) enables a high loop gain to achieve 0.297-mV/A load regulation and 0.024-mV/V line regulation. Furthermore, …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3702962
Publisher: IEEE

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Minimizing the Noise in Low-Current Sensing by MOSFET p-n Junction Diode Feedback

Minimizing the Noise in Low-Current Sensing by MOSFET p-n Junction Diode Feedback 150 150
Author(s): Ehsan Semsar Parapari, Marco Bennati, Michele Biondi, Marco Crescentini, Federico Thei

Abstract:

This letter proposes a transimpedance amplifier (TIA) architecture that minimizes noise for continuous-time (CT) low-current sensing. The approach leverages a MOSFET to realize a pure p-n junction diode as the TIA feedback element, such that MOS channel conduction is completely suppressed. Therefore, channel-induced noise contributions associated with conventional MOS-based feedback …

Published in: IEEE Solid-State Circuits Letters
Page(s): 162 – 165
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3692971
Publisher: IEEE

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A 6.9-ppm/°C, 0.66-mV/V Line Regulation, 50-mA Multi-Loop Low-Dropout Regulator With Integrated Single-BJT Voltage and Current References

A 6.9-ppm/°C, 0.66-mV/V Line Regulation, 50-mA Multi-Loop Low-Dropout Regulator With Integrated Single-BJT Voltage and Current References 150 150
Author(s): Raghav Bansal, Shouri Chatterjee

Abstract:

This article presents a fully integrated output-capacitor-less (OCL) multi-feedback-loop low-dropout regulator (LDO) with an in-built single bipolar junction transistor (BJT)-based voltage and current reference (VCR) for energy-harvesting Internet of Things (IoT) devices. The proposed architecture comprises four loops, which significantly enhance the DC regulation and transient performance of the …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 17
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3694415
Publisher: IEEE

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