Calibration

  • No Comments

A 4-GS/s 53.5-dB SNDR 12.9 fJ/conv. TI-SAR ADC with Capacitive Nonlinearity Compensation and Dual-Mode Offset Calibration

A 4-GS/s 53.5-dB SNDR 12.9 fJ/conv. TI-SAR ADC with Capacitive Nonlinearity Compensation and Dual-Mode Offset Calibration 150 150
Author(s): Jiazhen Ni, Dayi Zhou, Minqing Cai, Chen Chen, Xiang Gao, Seung-Chul Lee

Abstract:

Successive approximation register (SAR) analog-to-digital converters (ADCs) often employ dual-mode dynamic comparators to achieve both high speed and low noise. However, under low-supply operation, offset drift from mode transitions and degraded front-end linearity due to limited signal headroom become critical challenges. To address these issues, an adaptive current-injection scheme suppresses …

Published in: IEEE Solid-State Circuits Letters
Page(s): 1 – 1
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3713349
Publisher: IEEE

View on IEEE Xplore

  • No Comments

A 12-bit 1-GS/s SAR-Assisted Pipeline ADC With Gain-Stable Dual-Path Residue Amplification and Partially Look-Ahead Parallel Conversion

A 12-bit 1-GS/s SAR-Assisted Pipeline ADC With Gain-Stable Dual-Path Residue Amplification and Partially Look-Ahead Parallel Conversion 150 150
Author(s): Peng Wang, Yaning Wang, Fule Li, Zhihua Wang

Abstract:

This article presents a 12-bit, 1-GS/s SAR-assisted pipelined ADC implemented in 28-nm CMOS featuring accurate residue amplification (RA) with low gain variation. A dual-path residue amplifier embeds an open-loop gain-error-cancellation path within the closed-loop amplification path, providing accurate gain and robust gain stability without additional timing or power overhead. …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 14
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3713446
Publisher: IEEE

View on IEEE Xplore

  • No Comments

Current-Locked-Loop: A Circuit Topology for Reconfigurable High-Accuracy CMOS References

Current-Locked-Loop: A Circuit Topology for Reconfigurable High-Accuracy CMOS References 150 150
Author(s): Sining Pan, Xiaohan Liu, Ziyi Li, Minge Jiang, Yihang Cheng, Zhong Tang, Huaqiang Wu

Abstract:

This article introduces a circuit topology for building reconfigurable, high-accuracy CMOS current and voltage references, namely, current-locked-loop (CLL). The CLL regulates the $V_{\mathrm {GS}}$ of a current source transistor and thus its current output using a digitally assisted feedback loop, thereby enabling higher order temperature coefficient (TC) compensation and …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3711071
Publisher: IEEE

View on IEEE Xplore

  • No Comments

A 12-Gb/s Source-Synchronous Single-Ended PAM-4 Transceiver With Background Adaptive Crosstalk Equalization in 28-nm CMOS

A 12-Gb/s Source-Synchronous Single-Ended PAM-4 Transceiver With Background Adaptive Crosstalk Equalization in 28-nm CMOS 150 150
Author(s): DongArm Shin, Kuy Youn Chung, Sihoon Yang, SeongHwan Cho

Abstract:

This article presents a background adaptive crosstalk (XT) equalization technique for a single-endedfour-level pulse amplitude modulation (PAM-4) interface to maintain accurate XT cancellation (XTC) under environmental variations. A least-mean-square (LMS) adaptation loop adjusts the XT equalizer using a source-synchronous clock as an aggressor reference uncorrelated with the victim. At the …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 12
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3712021
Publisher: IEEE

View on IEEE Xplore

  • No Comments

A 108-Gb/s PAM-8 CTLE + FFE Receiver Front-End With 1.4-Vppd Input Range in 28-nm CMOS

A 108-Gb/s PAM-8 CTLE + FFE Receiver Front-End With 1.4-Vppd Input Range in 28-nm CMOS 150 150
Author(s): Sangwan Lee, Heedo Jeong, Hanhee Jo, Hwanseok Jung, Jaeduk Han

Abstract:

This article presents a 108-Gb/s 8-level pulse amplitude modulation (PAM-8) receiver front-end capable of handling a wide input dynamic range to overcome the signal-to-noise ratio (SNR) versus linearity tradeoff in higher-order modulation schemes. The proposed architecture employs a multi-path continuous-time linear equalizer (CTLE) with a bias-shifting technique, which splits …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 12
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3713392
Publisher: IEEE

View on IEEE Xplore

  • No Comments

A 12 b 180-MS/s Pipelined-SAR ADC With a Low-Power Calibration-Free RA and Hardware-Efficient SAR Logic

A 12 b 180-MS/s Pipelined-SAR ADC With a Low-Power Calibration-Free RA and Hardware-Efficient SAR Logic 150 150
Author(s): Guo Wei, Rui Zhang, Fule Li, Hanjun Jiang, Zhihua Wang

Abstract:

This letter presents a 12-bit, 180-MS/s pipelined-SAR ADC in 65-nm CMOS. To eliminate the complex interstage gain-error calibration for a fast-response characteristic, a high-gain residue amplifier (RA) featuring a two-stage gain-boosting architecture is proposed. By removing the tail current, the RA significantly alleviates slew-rate and voltage headroom limitations. The …

Published in: IEEE Solid-State Circuits Letters
Page(s): 186 – 189
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3697220
Publisher: IEEE

View on IEEE Xplore

  • No Comments

A Low-Spur Fractional-N DPLL With Analog Pre-Distortion DTC Implementing Second-/Third-Order Calibration

A Low-Spur Fractional-N DPLL With Analog Pre-Distortion DTC Implementing Second-/Third-Order Calibration 150 150
Author(s): Daxu Zhang, Yuncheng Zhang, Dingxin Xu, Hongye Huang, Waleed Madany, Zezheng Liu, Wenqian Wang, Yuang Xiong, Ashbir Aviat Fadila, Duo Li, Minzhe Tang, Dongfan Xu, Atsushi Shirane, Kenichi Okada

Abstract:

This article presents a low-spur, low-jitter fractional-N digital phase-locked loop (DPLL) employing an analog pre-distortion digital-to-time converter (APD-DTC) to suppress fractional spurs by compensating for both second- and third-order nonlinearities without using complex digital pre-distortion. To support background calibration, a spur-level detection scheme using phase detector gain (PDG) is proposed …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 17
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3706350
Publisher: IEEE

View on IEEE Xplore

  • No Comments

A 129–146-GHz Direct-Digital Modulation FinFET Transmitter With On-Chip Mismatch Calibrations for Beyond-5G Wireless Communications

A 129–146-GHz Direct-Digital Modulation FinFET Transmitter With On-Chip Mismatch Calibrations for Beyond-5G Wireless Communications 150 150
Author(s): Runzhou Chen, Hao-Yu Chien, Boxun Yan, Chao-Jen Tien, Mau-Chung Frank Chang

Abstract:

This article presents a D-band direct-digital modulation (DDM) transmitter with on-chip digital calibration blocks for future beyond-5G (B5G) wireless communication. The proposed DDM architecture mitigates the need for complex intermediate frequency (IF) generation and power-hungry digital-to-analog converters (DACs). The transmitter is implemented primarily in TSMC’s 16-nm p-FinFETs, …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1776 – 1790
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3644224
Publisher: IEEE

View on IEEE Xplore

  • No Comments

A 1.1-nJ/Conversion RC-Discharge-Based Resistance Sensor With ±0.65% (3σ) 1 -Point Trimmed Inaccuracy in 0.18-μm CMOS Technology

A 1.1-nJ/Conversion RC-Discharge-Based Resistance Sensor With ±0.65% (3σ) 1 -Point Trimmed Inaccuracy in 0.18-μm CMOS Technology 150 150
Author(s): Mu Wu, Yihang Cheng, Xingli Cui, Sining Pan, Huaqiang Wu

Abstract:

This letter presents an energy-efficient RC discharge-based sensor readout circuit for sub-kilo-ohm resistance measurements. An SAR logic is implemented to adjust the DAC capacitor array to equalize the RC time constants of the resistance-sensing and DAC branches, thereby eliminating the high static current required to bias the small sensing resistor. …

Published in: IEEE Solid-State Circuits Letters
Page(s): 109 – 112
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3677301
Publisher: IEEE

View on IEEE Xplore

Search this website