Calibration

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A 1.1-nJ/Conversion RC-Discharge-Based Resistance Sensor With ±0.65% (3σ) 1 -Point Trimmed Inaccuracy in 0.18-μm CMOS Technology

A 1.1-nJ/Conversion RC-Discharge-Based Resistance Sensor With ±0.65% (3σ) 1 -Point Trimmed Inaccuracy in 0.18-μm CMOS Technology 150 150
Author(s): Mu Wu, Yihang Cheng, Xingli Cui, Sining Pan, Huaqiang Wu

Abstract:

This letter presents an energy-efficient RC discharge-based sensor readout circuit for sub-kilo-ohm resistance measurements. An SAR logic is implemented to adjust the DAC capacitor array to equalize the RC time constants of the resistance-sensing and DAC branches, thereby eliminating the high static current required to bias the small sensing resistor. …

Published in: IEEE Solid-State Circuits Letters
Page(s): 109 – 112
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3677301
Publisher: IEEE

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A 40-GS/s 8-bit Time-Interleaved ADC Featuring SFDR-Enhanced Sampling and Power-Efficient Time-Domain Quantization in 28-nm CMOS

A 40-GS/s 8-bit Time-Interleaved ADC Featuring SFDR-Enhanced Sampling and Power-Efficient Time-Domain Quantization in 28-nm CMOS 150 150
Author(s): Chenghao Zhang, Maliang Liu, Yuan Chang, Yihang Yang, Jinhai Xiao, Yintang Yang, Yong Chen

Abstract:

This article reports a 40-GS/s 8-bit time-interleaved (TI) time-domain (TD) gated-ring-oscillator analog-to-digital converter (GRO-ADC). An interleaving number of 32 is achieved with a single-channel 8-bit GRO-ADC operating at 1.25 GS/s, leading to a low front-end design complexity compared to recently published arts. The sampling front end employs a linearity-enhanced boosted …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 15
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3671459
Publisher: IEEE

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Xiling: Cryo-CMOS Manipulator Using Dual 18-bit R-2R DACs for Single-Electron Transistor at 60 mK

Xiling: Cryo-CMOS Manipulator Using Dual 18-bit R-2R DACs for Single-Electron Transistor at 60 mK 150 150
Author(s): Yingjie Li, Yifei Zhang, Haichuan Lin, Cheng Wang

Abstract:

Millions of quantum-bits (qubits) are envisioned for a fault-tolerant quantum computer. For scalability, silicon spin qubit stands out due to its compatibility with advanced CMOS processes. Silicon single-electron transistors (SETs) are widely adopted for the quantum state discrimination of spin qubits. For high-fidelity quantum logic gate and readout, the gate …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3671795
Publisher: IEEE

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A 23.4–42.1-GHz Fractional-N Synthesizer With ADC-Based Direct Phase Digitization

A 23.4–42.1-GHz Fractional-N Synthesizer With ADC-Based Direct Phase Digitization 150 150
Author(s): Hao Xu, Yizhuo Wang, Ziyang Jiao, Guoyu Li, Yiyun Mao, Shuai Liu, Yan Liu, Jimiao Sang, Qi Guo, Long Kong, Na Yan

Abstract:

A fractional-N digital phase-locked loop employs a novel analog-to-digital converter (ADC)-based phase detector (PD) to achieve direct phase digitization, thereby eliminating the need for a digital-to-time converter (DTC). The high PD gain reduces in-band phase noise, while its high linearity enables all-digital $\Sigma \Delta $ quantization noise cancellation. Implemented with …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 15
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3671094
Publisher: IEEE

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A 12-bit 1-GS/s Current-Steering DAC With Paired Current Source Switching Background Mismatch Calibration

A 12-bit 1-GS/s Current-Steering DAC With Paired Current Source Switching Background Mismatch Calibration 150 150
Author(s): Chang-Un Park, Jae-Hyun Chung, Chunsuk Kim, Hyun-Woo Shin, Charlie Tahar, Seung-Tak Ryu

Abstract:

This article presents a spur-suppressed background calibration technique for high-speed current-steering digital-to-analog converters (DACs), based on a paired current source (CS) switching scheme. In conventional background calibration, periodic switching of CSs to and from the calibration mode introduces unwanted glitches that appear as spurious tones. The proposed technique introduces an …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 11
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3668788
Publisher: IEEE

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An Aging-Robust 32-MHz RC Frequency Reference With 0.4-ppm Allan Deviation and ±1550-ppm Inaccuracy From −40 °C to 125 °C After a 1-Point Trim

An Aging-Robust 32-MHz RC Frequency Reference With 0.4-ppm Allan Deviation and ±1550-ppm Inaccuracy From −40 °C to 125 °C After a 1-Point Trim 150 150
Author(s): Sining Pan, Xiaohan Liu, Junlong Zeng, Yihang Cheng, Kofi. A. A. Makinwa, Huaqiang Wu

Abstract:

This letter presents an aging-robust 32-MHz RC frequency reference based on a frequency-locked-loop (FLL). With a temperature compensation scheme that combines BJTs and aging-robust diffusion resistors, the FLL achieves ±1550-ppm inaccuracy from $-40~^{\circ }$ C to $125~^{\circ }$ C after batch calibration and a low-cost 1-point trim, which increases to ±2350-ppm …

Published in: IEEE Solid-State Circuits Letters
Page(s): 81 – 84
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3664504
Publisher: IEEE

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A 19.4-fsRMS Jitter 0.1-to-44-GHz Cryo-CMOS Fractional-N CP-PLL Featuring Automatic Bleed Calibration for Quantum Computing

A 19.4-fsRMS Jitter 0.1-to-44-GHz Cryo-CMOS Fractional-N CP-PLL Featuring Automatic Bleed Calibration for Quantum Computing 150 150
Author(s): Jinhai Xiao, Yong Chen, Ningyi Zhang, Xiaolong Liu, Rui Liu, Junao Zhu, Chenghao Zhang, Peng Luo, Maliang Liu, Yintang Yang, Xiaohua Ma, Yue Hao

Abstract:

Cryogenic fractional- $N$ phase-locked loops (PLLs) are essential for large-scale superconducting quantum computing, and serve as integrated pump sources for Josephson parametric amplifiers. These PLLs enable high-fidelity qubit readout while reducing the thermal load and wiring complexity associated with room-temperature generators. However, the cryogenic pump sources developed thus far were …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 19
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3653994
Publisher: IEEE

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A Compact, Wideband Complex Cascode Power Amplifier With LC Neutralization for VSWR-Resilient Operation in High-Density Phased Arrays

A Compact, Wideband Complex Cascode Power Amplifier With LC Neutralization for VSWR-Resilient Operation in High-Density Phased Arrays 150 150
Author(s): Mohamed Eleraky, Tzu-Yuan Huang, Hua Wang

Abstract:

This article proposes a design methodology for achieving intrinsic performance resilience in power amplifiers (PAs) against antenna impedance variations inherent to modern phased-array systems through the improvement of the PA output matching ( $S!_{22}$ ). This goal, however, presents a challenge for conventional cascode PAs due to their inherently high output impedance …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 16
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3654669
Publisher: IEEE

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On-Chip Charge-Trap-Transistor-Based Mismatch Calibration of an 8-Bit Thermometer Current-Source DAC

On-Chip Charge-Trap-Transistor-Based Mismatch Calibration of an 8-Bit Thermometer Current-Source DAC 150 150
Author(s): Mohammadreza Zeinali, Sudhakar Pamarti

Abstract:

This letter presents an on-chip mismatch calibration technique for current-source digital-to-analog converters (DACs) using charge-trap transistors (CTTs) in 22-nm FDSOI technology. The proposed method exploits programmable threshold voltage (VTH) shifts in CTTs to locally tune the current of near-minimum-sized devices without external trimming. A compact 8-bit thermometer DAC is implemented …

Published in: IEEE Solid-State Circuits Letters
Page(s): 53 – 56
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3656261
Publisher: IEEE

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