IEEE Solid-State Circuits Letters – Journals

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A 0.68 nJ/solution Inverse-Matrix-Vector Multiplication Solver With Decoupled Input Injection Scheme in 65-nm CMOS

A 0.68 nJ/solution Inverse-Matrix-Vector Multiplication Solver With Decoupled Input Injection Scheme in 65-nm CMOS 150 150
Author(s): Hsiang-Chun Cheng, Mayank Palaria, Qiaochu Zhang, Shiyu Su, Mike Shuo-Wei Chen

Abstract:

This letter presents an analog inverse-matrix-vector multiplication (IMVM) solver that addresses the input loading limitation of prior crossbar-based implementations. The proposed decoupled input injection scheme isolates the input circuit from the crossbar array, enabling the use of smaller crossbar conductance for lower power consumption and relaxing the required op amp …

Published in: IEEE Solid-State Circuits Letters
Page(s): 222 – 225
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3717659
Publisher: IEEE

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A 1.2-V, 8.5-ns Settling, Bi-Slewing CMOS Driver for Heavy Loads in Discrete-Time Analog Computing Applications

A 1.2-V, 8.5-ns Settling, Bi-Slewing CMOS Driver for Heavy Loads in Discrete-Time Analog Computing Applications 150 150
Author(s): Maysara Hamada, Mostafa Toubar, Zixu Wang, Nishant Bakshi, Hsiang-Chun Cheng, Mayank Palaria, Joshua Yang, Mike Shuo-Wei Chen

Abstract:

As crossbar-based analog computing grows in popularity for high-speed, energy-efficient processing, the need to drive discrete-time signals to heavy loads arises. This letter presents a novel bi-slewing CMOS driver utilizing high slew-rate error amplifiers and a push–pull stage. The proposed driver achieves a measured settling time of 8.5 ns and …

Published in: IEEE Solid-State Circuits Letters
Page(s): 218 – 221
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3717852
Publisher: IEEE

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Merged-Reference-Compatible Offset-Canceling Discharge-Based Sensing Circuit for STT-MRAM in 28-nm CMOS

Merged-Reference-Compatible Offset-Canceling Discharge-Based Sensing Circuit for STT-MRAM in 28-nm CMOS 150 150
Author(s): Jaeyong Jang, Mingu Han, Jaehwan Kim, Taehui Na

Abstract:

This article proposes an offset-canceling (OC) discharge-based sensing circuit (OCDC) for spin-transfer-torque magnetic random access memory (STT-MRAM). The proposed circuit simultaneously implements a merged reference line (MRL) architecture and threshold voltage ( $\mathbf {V}_{\mathbf {TH}}$ ) mismatch cancellation, resolving the structural incompatibility between the conventional OC schemes and MRL. A diode-connection-based, …

Published in: IEEE Solid-State Circuits Letters
Page(s): 210 – 213
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3715234
Publisher: IEEE

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A Low-Power MRAM-Based Nonvolatile Flip-Flop Architecture for Register and System Applications

A Low-Power MRAM-Based Nonvolatile Flip-Flop Architecture for Register and System Applications 150 150
Author(s): Bayartulga Ishdorj, Taehui Na

Abstract:

This work presents a minimal nonvolatile flip-flop (NVFF) hybrid architecture and an NV static contention-free differential FF (nvSCDFF) cell that reduces the overhead associated with replicated NV circuitry in conventional in situ NVFFs while enabling low power. By using only one NVFF per column and compact SCDFF-based volatile flip-flops (FFs), …

Published in: IEEE Solid-State Circuits Letters
Page(s): 206 – 209
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3713204
Publisher: IEEE

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A 4-GS/s 53.5-dB SNDR 12.9 fJ/conv. TI-SAR ADC With Capacitive Nonlinearity Compensation and Dual-Mode Offset Calibration

A 4-GS/s 53.5-dB SNDR 12.9 fJ/conv. TI-SAR ADC With Capacitive Nonlinearity Compensation and Dual-Mode Offset Calibration 150 150
Author(s): Jiazhen Ni, Dayi Zhou, Minqing Cai, Chen Chen, Xiang Gao, Seung-Chul Lee

Abstract:

Successive approximation register (SAR) analog-to-digital converters (ADCs) often employ dual-mode dynamic comparators to achieve both high speed and low noise. However, under low-supply operation, offset drift from mode transitions and degraded front-end linearity due to limited signal headroom become critical challenges. To address these issues, an adaptive current-injection scheme suppresses …

Published in: IEEE Solid-State Circuits Letters
Page(s): 214 – 217
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3713349
Publisher: IEEE

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A Sampling PLL With Boosted Phase Detection Gain Achieving 52 fs RMS Jitter and 110.4 MHz Lock-In Range

A Sampling PLL With Boosted Phase Detection Gain Achieving 52 fs RMS Jitter and 110.4 MHz Lock-In Range 150 150
Author(s): Hyogyoung An, Changmin An, Sungjin Kim, Heein Yoon

Abstract:

This work presents a sampling phase-locked loop (SPLL) that simultaneously achieves sub-sampling SPLL (SSPLL)-level jitter and wide lock-in range ( $f_{\mathbf {lock}}$ ) inherent to SPLL architecture. By employing a high phase detection gain, the proposed SPLL ensures low in-band phase noise (PN) dominated by reference, while maintaining robust re-locking …

Published in: IEEE Solid-State Circuits Letters
Page(s): 202 – 205
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3710778
Publisher: IEEE

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A 6-bit Serializer With Integrated Manchester Encoder Using Flexible a-IGZO TFT Technology

A 6-bit Serializer With Integrated Manchester Encoder Using Flexible a-IGZO TFT Technology 150 150
Author(s): Suyash Shrivastava, Pydi Ganga Bahubalindruni

Abstract:

This article presents an experimental characterization of a novel 6-bit parallel-to-serial data converter integrated with a Manchester encoder. The system comprises an on-chip digital logic block that generates six mutually nonoverlapping control signals ( $\phi _{0-5}$ ) and three 120° phase-shifted clock signals to drive the switching transistors in the serializer and the …

Published in: IEEE Solid-State Circuits Letters
Page(s): 194 – 197
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3707465
Publisher: IEEE

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A 58.9–73.7-GHz Quadrature Dual-Core Class-F₃,₅ Oscillator With Tail-Assisted Implicit Quintupling

A 58.9–73.7-GHz Quadrature Dual-Core Class-F₃,₅ Oscillator With Tail-Assisted Implicit Quintupling 150 150
Author(s): Yevhenii Mormul, Patchara Sawakewang, Sayan Kumar, Chawin Khongprasongsiri, Teerachot Siriburanon, Robert Bogdan Staszewski

Abstract:

We introduce a new class-F3,5 oscillator topology that enables quadrature operation by duplicating a conventional class-F3 oscillator core and electromagnetically coupling the two cores through a pair of additional coils feeding source terminals of the $g_{m}$ transistors. The coupling network enhances the fifth-harmonic component, enabling efficient extraction and quadrature …

Published in: IEEE Solid-State Circuits Letters
Page(s): 198 – 201
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3699799
Publisher: IEEE

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An IEEE802.15.4a/z/ab Compatible IR-UWB 2TRX With Full-Duplex Radar Sensing and Aliasing Suppressing Semisynchronous TX

An IEEE802.15.4a/z/ab Compatible IR-UWB 2TRX With Full-Duplex Radar Sensing and Aliasing Suppressing Semisynchronous TX 150 150
Author(s): Anoop Narayan Bhat, Erwin Allebes, Elbert Bechthum, Zule Xu, Stan van der Ven, Mohieddine El Soussi, Johan van Den Heuvel, Paul van Zeijl, Paul Mateman, Murat Eskiyerli, Stefano Traferro, Amirashkan Farsaei, Evgenii Tiurin, Sahan Gamage, Pepijn Boer, Igor Petrov, Jochem Govers, Huib Visser, Martijn Hijdra, Sharada Prasad Shantharam, Ivo Marques, Gururaja Kasanadi Ramachandra, Kaijie Ding, Ran Li, Aasish Boora, Peter Vis, Mario Konijnenburg, Arjan Breeschoten, Peng Zhang, Yao-Hong Liu, Christian Bachmann

Abstract:

This letter presents an 802.15.4ab/a/z compatible IR-UWB 2TRX highlighting a full-duplex-based radar, a semisynchronous TX and TRX’s digital baseband. A capacitive tuning technique proposed in the electrical balance duplexer (EBD)-based duplex RF front-end (RF-FE) improves TX-antenna insertion loss by 1.4 dB and the sensitivity of TX–RX …

Published in: IEEE Solid-State Circuits Letters
Page(s): 190 – 193
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3697493
Publisher: IEEE

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