Announcing Inaugural IEEE Journal of Solid-State Circuits Test of Time Award

Announcing Inaugural IEEE Journal of Solid-State Circuits Test of Time Award

Announcing Inaugural IEEE Journal of Solid-State Circuits Test of Time Award 870 489 Aeisha VanBuskirk

As Editor-in-Chief, it is my pleasure to announce the launch of the IEEE Journal of Solid-State Circuits (JSSC) Test of Time Award.  This highly prestigious new award will recognize a truly outstanding paper published in the Society’s flagship journal at least 10 years prior that has had significant impact on its field.  The award will be selected based on impact on the field, technical excellence, clarity of writing, and novelty.  Nominations will be required to specifically and quantitatively show the long-term and sustained impact of the paper on the integrated circuit field.

This will be a bi-annual award and will be given only if a suitable awardee is identified.  Self-nominations are not allowed.  The nomination period will be open from April 1, 2025 to September 30, 2025.   Details on the nomination process are available at https://sscs.ieee.org/membership/awards/jssc-test-of-time-award/#

Sincerely,

Dennis Sylvester (Editor-in-Chief)