Iron

An IEEE802.15.4a/z/ab compatible IR-UWB 2TRX with full-duplex radar sensing and aliasing suppressing semi-synchronous TX

An IEEE802.15.4a/z/ab compatible IR-UWB 2TRX with full-duplex radar sensing and aliasing suppressing semi-synchronous TX 150 150

Abstract:

This letter presents an 802.15.4ab/a/z compatible IR-UWB 2TRX highlighting a full-duplex-based radar, a semi-synchronous TX and TRX’s digital baseband. A capacitive tuning technique proposed in the electrical balance duplexer (EBD)-based duplex RF front-end (RF-FE) improves TX-antenna insertion loss by 1.4dB and the sensitivity of TX-RX isolation …

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A 7.5-μW 35-Keyword End-to-End Keyword Spotting System With Random Augmented On-Chip Training

A 7.5-μW 35-Keyword End-to-End Keyword Spotting System With Random Augmented On-Chip Training 150 150

Abstract:

Fully integrated keyword spotting (KWS) systems designed for low-power operation face two major challenges. First, increasing the number of supported keywords significantly raises system complexity and power consumption. Second, most existing systems are not personalized to individual users, as they are trained on data from native English speakers, leading to …

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A SPICE-Compatible Compact Model of Ferroelectric Diode

A SPICE-Compatible Compact Model of Ferroelectric Diode 150 150

Abstract:

In this work, for the first time, we present a SPICE-compatible compact model of ferroelectric (FE) diodes to enable their design exploration for diverse applications, including memory and unconventional computing paradigms. We propose modified Schottky barrier and hopping models for capturing the on- and off-mode operations of the FE diode, …

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A Bit-Cell Failure Analysis Framework for Ferroelectric Field-Effect Transistor-Based Memories

A Bit-Cell Failure Analysis Framework for Ferroelectric Field-Effect Transistor-Based Memories 150 150

Abstract:

The ferroelectric field-effect transistor (FeFET) is a promising memory device technology due to desirable attributes, such as fast access times, high memory cell density, good endurance, compatibility with CMOS process, and impressive scalability. While previous research has explored the impact of process variations at the device level, their effects on …

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Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors

Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors 150 150

Abstract:

We utilized phase-field simulations to investigate the effects of polar-axis (PA) orientation fluctuations on the extrinsic properties of single ferroelectric (FE) grains, focusing on the coercive electrical field (EC) and the remnant polarization (Pr). The underlying mechanisms through which PA orientation fluctuations influence polarization behavior are studied to gain insights …

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Cryogenic Hyperdimensional In-Memory Computing Using Ferroelectric TCAM

Cryogenic Hyperdimensional In-Memory Computing Using Ferroelectric TCAM 150 150

Abstract:

Cryogenic operations of electronics present a significant step forward to achieve huge demand of in-memory computing (IMC) for high-performance computing, quantum computing, and military applications. Ferroelectric (FE) is a promising candidate to develop the complementary metal oxide semiconductor (CMOS)-compatible nonvolatile memories. Hence, in this work, we investigate the effectiveness …

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