Circuit synthesis

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Denim: Heterogeneous Compute-in-Memory Accelerator Exploiting Denoising–Similarity for Diffusion Models

Denim: Heterogeneous Compute-in-Memory Accelerator Exploiting Denoising–Similarity for Diffusion Models 150 150
Author(s): Ruiqi Guo, Lei Wang, Xiaofeng Chen, Keyi Jiang, Zhiheng Yue, Huiming Han, Yang Wang, Fengbin Tu, Shaojun Wei, Yang Hu, Shouyi Yin

Abstract:

Diffusion models have recently revolutionized the field of image synthesis due to their ability to generate photorealistic images. However, one of the main drawbacks of diffusion models is that the image generation process is expensive. Large image-to-image networks have to be applied multiple times in order to iteratively optimize the …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 15
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3684745
Publisher: IEEE

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A 16× Interleaved 32-GS/s 8b Hybrid ADC With Self-Tracking Inter-Stage Gain Achieving 44.3-dB SFDR at 20.9-GHz Input

A 16× Interleaved 32-GS/s 8b Hybrid ADC With Self-Tracking Inter-Stage Gain Achieving 44.3-dB SFDR at 20.9-GHz Input 150 150
Author(s): Hongzhi Liang, Jun Chang, Yixiao Luo, Li Dang, Haolin Han, Yi Shen, Dengquan Li, Shubin Liu, Ruixue Ding, Zhangming Zhu

Abstract:

This article presents a 32-GS/s 16-channel hierarchical time-interleaved (TI) hybrid analog-to-digital converter (ADC). The prototype utilizes the intrinsic high-speed quantization of time-domain (TD) ADC to reduce the interleaving factor. By incorporating hierarchical sampling and a cascode sampler, the compact TI-ADC achieves 44.3-dB spurious-free dynamic range (SFDR) at 20.9-GHz input. …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 11
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3680919
Publisher: IEEE

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A 95.3% Efficiency APT/AET/SPT Multimode Multiband CMOS/GaN Envelope Tracking for 6G-Oriented Systems

A 95.3% Efficiency APT/AET/SPT Multimode Multiband CMOS/GaN Envelope Tracking for 6G-Oriented Systems 150 150
Author(s): Chun-Yuan Chen, Yi-Chun Huang, Ke-Horng Chen, Ying-Hsi Lin, Shian-Ru Lin, Tsung-Yen Tsai

Abstract:

This article proposes an envelope-tracking (ET) supply modulator (SM) that is scalable for sixth-generation (6G) communication systems. The design leverages a cost-efficient CMOS process for the power converters and a high-performance GaN process for the high-frequency power amplifier (PA) and the depletion-mode-only GaN-based amplifier. The proposed ET supply modulator (ETSM) …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 12
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3681319
Publisher: IEEE

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An 800-MS/s 13-b 2× TI Pipelined-SAR ADC With Rapid Digital Amplification

An 800-MS/s 13-b 2× TI Pipelined-SAR ADC With Rapid Digital Amplification 150 150
Author(s): Peizhe Li, Danfeng Zhai, Qi Liu, Chixiao Chen

Abstract:

This work proposes a rapid digital amplification (RDA) with residue-aware reference, offering an equivalent open-loop (OL) gain enhancement of 25 dB and reducing the interstage gain error (ISGE)-induced SNR degradation by 20 dB, with an extra amplification latency of only 200 ps. It is implemented in an 800-MS/s 13-b two-way time-interleaved (…

Published in: IEEE Solid-State Circuits Letters
Page(s): 137 – 140
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3684735
Publisher: IEEE

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Self-Enabled Write Assist Cells for High-Density SRAM in Resistance-Dominated Technology Node

Self-Enabled Write Assist Cells for High-Density SRAM in Resistance-Dominated Technology Node 150 150
Author(s): Minjune Yeo, Seungjae Yei, Keonhee Cho, Giseok Kim, Mingu Kang, Seong-Ook Jung

Abstract:

As technology scaling increases interconnect resistance, writeability degradation in static random access memory (SRAM) becomes critical. This article presents a self-enabled write assist cell (SEWAC) that mitigates writeability degradation caused by increased bitline resistance (R ${}_{\mathrm {BL}}$ ) without requiring timing control. The SEWAC has a cell-compatible layout with the standard 6…

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 11
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3681916
Publisher: IEEE

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