Cells (biology)

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Merged-Reference-Compatible Offset-Canceling Discharge-Based Sensing Circuit for STT-MRAM in 28-nm CMOS

Merged-Reference-Compatible Offset-Canceling Discharge-Based Sensing Circuit for STT-MRAM in 28-nm CMOS 150 150
Author(s): Jaeyong Jang, Mingu Han, Jaehwan Kim, Taehui Na

Abstract:

This article proposes an offset-canceling (OC) discharge-based sensing circuit (OCDC) for spin-transfer-torque magnetic random access memory (STT-MRAM). The proposed circuit simultaneously implements a merged reference line (MRL) architecture and threshold voltage ( $\mathbf {V}_{\mathbf {TH}}$ ) mismatch cancellation, resolving the structural incompatibility between the conventional OC schemes and MRL. A diode-connection-based, …

Published in: IEEE Solid-State Circuits Letters
Page(s): 210 – 213
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3715234
Publisher: IEEE

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A Low-Power MRAM-Based Nonvolatile Flip-Flop Architecture for Register and System Applications

A Low-Power MRAM-Based Nonvolatile Flip-Flop Architecture for Register and System Applications 150 150
Author(s): Bayartulga Ishdorj, Taehui Na

Abstract:

This work presents a minimal nonvolatile flip-flop (NVFF) hybrid architecture and an NV static contention-free differential FF (nvSCDFF) cell that reduces the overhead associated with replicated NV circuitry in conventional in situ NVFFs while enabling low power. By using only one NVFF per column and compact SCDFF-based volatile flip-flops (FFs), …

Published in: IEEE Solid-State Circuits Letters
Page(s): 206 – 209
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3713204
Publisher: IEEE

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Open DRAM Model—Part I: Cross-Layer Device, Array, and Circuit Analysis With BL-to-BL Coupling Mitigation for 4F2 VCT DRAM

Open DRAM Model—Part I: Cross-Layer Device, Array, and Circuit Analysis With BL-to-BL Coupling Mitigation for 4F2 VCT DRAM 150 150
Author(s): Kiseok Lee, Seongkwang Lim, Suman Datta, Shimeng Yu

Abstract:

Dynamic random access memory (DRAM) scaling toward 4F2 vertical channel transistors (VCTs) fundamentally reshapes device, array, and circuit-level design tradeoffs. However, the lack of an open-source DRAM device model that is calibrated with recent industry trends prohibits broader innovations in the research community. In this work, we present an “Open …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 135 – 143
Year of Publication: 2026
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2026.3704358
Publisher: IEEE

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A Continuous-Time Incremental Zoom ADC With Extended Quantization, Easy-to-Drive Capacitive Input and Deadband-Embedded Gm-C Loop Filter

A Continuous-Time Incremental Zoom ADC With Extended Quantization, Easy-to-Drive Capacitive Input and Deadband-Embedded Gm-C Loop Filter 150 150
Author(s): Chaoyang Xing, Yilu Cui, Yi Zhong, Nan Sun, Lu Jie

Abstract:

This article presents a continuous-time (CT) analog-to-digital converter (ADC) featuring an incremental zoom with extended quantization architecture. The proposed MASH topology comprises an 8-bit oversampled successive-approximation register (SAR) ADC as the first stage, a 1-bit incremental CT delta-sigma modulator (CT-DSM) as the second stage, and a 12-bit Nyquist SAR ADC …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3717666
Publisher: IEEE

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A 194.6-TOPS/W Pipelined All Current-Domain Mixed-Signal Compute in Memory in 28-nm CMOS

A 194.6-TOPS/W Pipelined All Current-Domain Mixed-Signal Compute in Memory in 28-nm CMOS 150 150
Author(s): Saideep Cherukuri, N. V. Kidambi, W. C. Wang, I. Chakraborty, S. Zhang, L. Shamieh, J. B. Steinberg, S. Mukhopadhyay

Abstract:

Mixed-signal CIM (MS-CIM) faces bit-cell nonlinearity, poor linearity at high frequency, and throughput limits. We present a hybrid pipelined current-domain MS-CIM macro featuring bit-cell matched linearization interface (BMLI) and loop-unrolled successive approximation refinement (SAR) ADC fabricated in 28-nm CMOS. A $256{\,}\times {\,}256$ SRAM array with 8-bit inputs, 8-bit weights achieve 10.16-TOPS …

Published in: IEEE Solid-State Circuits Letters
Page(s): 174 – 177
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3697990
Publisher: IEEE

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Building Minimum-Power Digital Circuits With Sub-Femtowatt Dynamic Leakage-Suppression Logic Standard Cells

Building Minimum-Power Digital Circuits With Sub-Femtowatt Dynamic Leakage-Suppression Logic Standard Cells 150 150
Author(s): Daniel S. Truesdell, Jacob Breiholz, Benton H. Calhoun

Abstract:

This article investigates dynamic leakage-suppression (DLS) logic for minimum-power operation in digital circuits. The DLS logic family uses a strong intrinsic subthreshold leakage reduction technique and is an emerging approach for computing applications that prioritize low active power at or beneath the nW-level. We analytically model the key operating characteristics …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 15
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3709741
Publisher: IEEE

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A Quadrature-Rotation Phased-Array Transmitter With High-Resolution Phase Tuning and Complex Domain Power Back-Off Efficiency Enhancement

A Quadrature-Rotation Phased-Array Transmitter With High-Resolution Phase Tuning and Complex Domain Power Back-Off Efficiency Enhancement 150 150
Author(s): Jie Zhou, Bingzheng Yang, Hongxin Tang, Xun Luo

Abstract:

In this article, a four-element digital-modulated phased-array transmitter based on quadrature switched/floated-capacitor power amplifiers (SFCPAs) and reconfigurable switched-capacitor tuning lines (RSCTLs) is proposed. Phase shifting in each element is achieved by hybrid coarse and fine phase-tuning approaches. The SFCPAs with the quadrature-rotation technique are presented for coarse phase tuning. …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 15
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3702007
Publisher: IEEE

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