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IEEE Solid-State Circuits Directions Series: Think Impact with ICs: Solid State Circuits and Devices in Extreme Radiation Environments
IEEE Solid-State Circuits Directions Series: Think Impact with ICs: Solid State Circuits and Devices in Extreme Radiation Environments
Register here: https://ieee.webex.com/weblink/register/raf95ee78000bd7ad20cf435926c4905c Organized by: Maurits Ortmanns Co-sponsored by: IEEE Electron Devices Society, IEEE Reliability Society Agenda: Radiation Effects on semiconductors components. Soumyajit Mandal, BNL. 30 min + 5min Q&A Radiation Hardening By Design (RHBD) in CMOS standard process. Cristiano Calligaro, RedCat Devices. 30 min + 5min Q&A On-Chip Infrastructure for Mission-Mode Monitoring of Resilient […]