Voltage control

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A Linear Dynamic Voltage Scaling Technique With Adaptive Minimum Voltage Headroom Tracking for Implantable Neurostimulation

A Linear Dynamic Voltage Scaling Technique With Adaptive Minimum Voltage Headroom Tracking for Implantable Neurostimulation 150 150
Author(s): Kai Cui, Honglei Xu, Yingduo Duan, Yan Lu, Xiaoya Fan, Yanzhao Ma

Abstract:

This letter presents a linear dynamic voltage scaling (DVS) technique using a dual-loop multistage charge-pump maintaining the minimum voltage headroom for implantable neurostimulation. By adopting an analog DVS with adaptive feedback divider, the stimulus current source could be always kept operating at the boundary of the saturation region and the …

Published in: IEEE Solid-State Circuits Letters
Page(s): 261 – 264
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3608096
Publisher: IEEE

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A Unified Early-Warning AVFS Design With Path Activation-Aware Monitoring Point Optimization

A Unified Early-Warning AVFS Design With Path Activation-Aware Monitoring Point Optimization 150 150
Author(s): Cai Li, Kaize Zhou, Junyi Qian, Haochang Zhi, Weiwei Shan

Abstract:

This work proposes a unified early-warning adaptive voltage-frequency scaling (AVFS) system that offers a practical low-power solution for commercial IoT devices. First, a path activation-aware monitoring point optimization strategy is proposed to mitigate the risk of illegal voltage scaling. The strategy combines the path activation evaluation with the required timing …

Published in: IEEE Solid-State Circuits Letters
Page(s): 229 – 232
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3593960
Publisher: IEEE

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A High-Density Low-Leakage and Low-Power Fully Voltage-Stacked SRAM for IoT Application

A High-Density Low-Leakage and Low-Power Fully Voltage-Stacked SRAM for IoT Application 150 150
Author(s): Sekeon Kim, Giseok Kim, Kyeongrim Baek, Keonhee Cho, Hyunjun Kim, Yeonho Jung, Dongwook Seo, Sangyeop Baeck, Sungjae Lee, Seong-Ook Jung

Abstract:

The general approach to suppress leakage in static random access memory (SRAM) is to use a low voltage ( $V_{text {L}}$ ), generated by a low-dropout regulator (LDO), as the cell supply voltage (CVDD) of SRAM array in the standby mode. However, the effectiveness of lowering CVDD is constrained by the …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 12
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3582974
Publisher: IEEE

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Digital Low-Dropout Regulator-Assisted Buck DC-DC Converter Achieving 68-mV Droop Voltage and 95.5% Efficiency

Digital Low-Dropout Regulator-Assisted Buck DC-DC Converter Achieving 68-mV Droop Voltage and 95.5% Efficiency 150 150
Author(s): Yichen Xu, Zhaoqing Wang, Rentao Wan, Suhwan Kim, Minxiang Gong, Ram Krishnamurthy, Xin Zhang, Mingoo Seok

Abstract:

This paper proposes a digital low-dropout regulator (DLDO)-assisted buck converter featuring one-step computational droop compensation and DLDO feedback-controlled current handover. The 28-nm test chip achieves a 68-mV droop voltage and a 112-ns settling time for a 1A/0.8ns load step while maintaining a high peak efficiency of 95.5%.

Published in: IEEE Solid-State Circuits Letters
Page(s): 1 – 1
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3581844
Publisher: IEEE

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A 76.9 ppm/K Nano-Watt PVT-Insensitive CMOS Voltage Reference Operating From 4 to 300 K for Integrated Cryogenic Quantum Interface

A 76.9 ppm/K Nano-Watt PVT-Insensitive CMOS Voltage Reference Operating From 4 to 300 K for Integrated Cryogenic Quantum Interface 150 150
Author(s): Jing Wang, Jun He, Man-Kay Law, Xinzhe Wang, Futian Liang, Lin Cheng

Abstract:

This work proposes a temperature and process-compensated low-power Cryo-CMOS voltage reference without trimming for quantum integrated interface, which is capable of operating continuously from room temperature (RT) down to cryogenic temperatures. By compensating for the main accuracy limiting factors including the process dependence of the transistor threshold voltage, device mismatch …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 3242 – 3256
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3530472
Publisher: IEEE

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