Solid state circuits

A 40.68-MHz, 200-ns-Settling Active Rectifier for mm-Sized Implants

A 40.68-MHz, 200-ns-Settling Active Rectifier for mm-Sized Implants 150 150

Abstract:

This letter describes a fast-settling active rectifier for a 40.68 MHz wireless power transfer receiver for implantable applications. Fast-settling and low power are achieved through a novel direct voltage-domain compensation technique. The rectifier maintains high efficiency during load and link variations required for downlink communication. The system was fabricated in 40nm …

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24.86 Gb/s Full-Digital Chaos Random Number 1.53 GSamples/s Noise Generator in 40nm CMOS

24.86 Gb/s Full-Digital Chaos Random Number 1.53 GSamples/s Noise Generator in 40nm CMOS 150 150

Abstract:

This letter presents a fully digital true random number generator (TRNG) and noise generator (NG) based on a chaos system. We design the chaos random number generator (CRNG) using the proposed Euler-based modified Lorenz system with periodic perturbation and modified modulo unit. The chaos NG (CNG) processor integrates the CRNG …

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A 0-to- 10μF Off-Chip Output Capacitor-Scalable Boost Converter Achieving 96.68% Peak Efficiency

A 0-to- 10μF Off-Chip Output Capacitor-Scalable Boost Converter Achieving 96.68% Peak Efficiency 150 150

Abstract:

This letter presents an off-chip output capacitor (CO)-scalable (OCS) boost converter. The proposed OCS boost converter is possible to operate both with and without the off-chip CO. In addition, it operates in a whole conversion ratio (CR) range over 1 while maintaining a small current ripple of an inductor, resulting …

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Digital Low-Dropout Regulator-Assisted Buck DC-DC Converter Achieving 68-mV Droop Voltage and 95.5% Efficiency

Digital Low-Dropout Regulator-Assisted Buck DC-DC Converter Achieving 68-mV Droop Voltage and 95.5% Efficiency 150 150

Abstract:

This paper proposes a digital low-dropout regulator (DLDO)-assisted buck converter featuring one-step computational droop compensation and DLDO feedback-controlled current handover. The 28-nm test chip achieves a 68-mV droop voltage and a 112-ns settling time for a 1A/0.8ns load step while maintaining a high peak efficiency of 95.5%.

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