Abstract:
Spin-transfer-torque magnetic random-access memory (STT-MRAM) is attractive for nonvolatile one-bit sign-weight storage, but a favorable cell or local-read metric does not establish subsystem efficiency. We analyze a hybrid magnetic tunnel junction (MTJ)–complementary metal-oxide-semiconductor (CMOS) memory subsystem in which MTJs store static signs while sensing, reference generation, sign staging, scale …