Noise shaping

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A 0.0035-mm2 86-dB-SNR 1.25-MHz-BW Noise-Shaping SAR ADC Enabling kT/C Noise Shaping

A 0.0035-mm2 86-dB-SNR 1.25-MHz-BW Noise-Shaping SAR ADC Enabling kT/C Noise Shaping 150 150
Author(s): Xing Wang, Zhishuai Zhang, Yi Zhong, Nan Sun, Lu Jie

Abstract:

This work presents a compact second-order noise shaping successive approximation register (NS-SAR) analog-to-digital converter (ADC) featuring a novel kT/C noise shaping technique. The proposed kT/C noise shaping technique selectively suppresses kT/C noise within the signal bandwidth of an oversampled SAR ADC. It avoids using a wideband noise …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 2798 – 2808
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3616265
Publisher: IEEE

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A Calibration-Free Frequency-Scalable ΔΣ ADC Incorporating PVT-Robust Dynamic Integration

A Calibration-Free Frequency-Scalable ΔΣ ADC Incorporating PVT-Robust Dynamic Integration 150 150
Author(s): Tohru Kaneko, Hideaki Ishida, Yuzuru Yamaki, Satoshi Takehara, Un-Ku Moon

Abstract:

This article summarizes a calibration-free, frequency-scalable $Delta Sigma $ analog-to-digital converter (ADC) which employs dynamic open-loop integrators for low-power sensing systems. The integrators use a capacitive degeneration scheme to obtain an integration factor determined by a capacitor ratio. To enhance process-voltage-temperature (PVT) robustness, bottom-plate level shift (BPLS) and a timer are …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 14
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3719645
Publisher: IEEE

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A 92.1-dB SNDR Easy-Driving Two-Step NS-SAR-Based Incremental ADC With Concurrent Gain-Error Plus Noise Suppression

A 92.1-dB SNDR Easy-Driving Two-Step NS-SAR-Based Incremental ADC With Concurrent Gain-Error Plus Noise Suppression 150 150
Author(s): Chenyang Li, Tzu-Han Wang, Dongsuk Kang, Ken Li, Xitie Zhang, Wei-En Lee, Visvesh S. Sathe, Shaolan Li

Abstract:

This article presents a two-step incremental analog-to-digital converter (ADC) that achieves high resolution and energy efficiency while substantially easing the input driving constraints and interstage gain variation. By employing a level-shifted sub-ranging architecture with an input-tracking (IT) feature, the design obviates direct input sampling, thereby significantly relaxing the demands on …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 884 – 897
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3635146
Publisher: IEEE

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A Zero-Static-Power ADC With Integrated Dynamic Reference and Driver-Free Operation Achieving 58.6 dB SNDR From –40 °C to 85 °C

A Zero-Static-Power ADC With Integrated Dynamic Reference and Driver-Free Operation Achieving 58.6 dB SNDR From –40 °C to 85 °C 150 150
Author(s): Yiming Wang, Yihang Luan, Zhiliang Hong, Jiawei Xu

Abstract:

This letter presents a 10-bit ENOB charge-sharing SAR ADC with a fully integrated dynamic bandgap reference (BGR), enabling first-order noise shaping and ultralow-power (ULP) operation. The charge-sharing ADC and dynamic BGR form an ideal pair: both operate without static current, allowing compact integration and high precision. The SAR uses only …

Published in: IEEE Solid-State Circuits Letters
Page(s): 178 – 181
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3697203
Publisher: IEEE

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An Incremental Noise-Shaping Pipeline ADC With Single-Amplification-Based kT/C Noise Cancellation Technique

An Incremental Noise-Shaping Pipeline ADC With Single-Amplification-Based kT/C Noise Cancellation Technique 150 150
Author(s): Zongnan Wang, Bingrui Li, Jiajun Tang, Zhongyi Wu, Haoyang Luo, Yuan Wang, Xiyuan Tang

Abstract:

This article presents an incremental noise-shaping (NS) pipeline analog-to-digital converter (ADC) featuring a single-amplification-based kT/C noise cancellation technique. By pre-amplifying the frontend sampling kT/C noise onto the capacitive digital-to-analog converter (CDAC) of the backend NS successive approximation register (SAR) quantizer, the proposed architecture eliminates the repeated amplifications typically …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 12
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3698875
Publisher: IEEE

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A Noise-Shaping SAR-Based ExG Sensing Frontend With Dynamic Input-Impedance Boosting and Prediction-Assisted Mismatch-Shaping DEM

A Noise-Shaping SAR-Based ExG Sensing Frontend With Dynamic Input-Impedance Boosting and Prediction-Assisted Mismatch-Shaping DEM 150 150
Author(s): Yiming Han, Linran Zhao, Yaoyao Jia

Abstract:

This article presents a noise-shaping successive approximation register (NS-SAR)-based direct-digitizing electrophysiological (ExG) sensing frontend (SFE) fabricated in a standard 180-nm CMOS process. To address the challenges of large motion artifacts and high electrode–tissue impedance (ETI), we propose three key innovations in our proposed SFE that enable accurate ExG …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 15
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3674986
Publisher: IEEE

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A Calibration-Free Pipelined-SAR ADC With Cross-Stage Gain-Mismatch Error Shaping and Inherent Noise Shaping

A Calibration-Free Pipelined-SAR ADC With Cross-Stage Gain-Mismatch Error Shaping and Inherent Noise Shaping 150 150
Author(s): Jihang Gao, Yaohui Luan, Siyuan Ye, Jiajia Cui, Xinhang Xu, Linxiao Shen

Abstract:

This article presents a calibration-free pipelined-successive-approximation-register (SAR) analog-to-digital converter (ADC) based on the proposed cross-stage gain-mismatch-error shaping (CS-GMES) mechanism. The CS-GMES is realized by including the entire 2nd stage into MES operation to unify the gain error and the 2nd-stage mismatch error. A feedback capacitor provides cross-stage connection and mismatch …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3624412
Publisher: IEEE

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