MOSFET

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A 7056-PPI Pixel Circuit With Low-Leakage Structure for Active-Matrix Monochrome Micro-LED Displays

A 7056-PPI Pixel Circuit With Low-Leakage Structure for Active-Matrix Monochrome Micro-LED Displays 150 150
Author(s): Chih-Lung Lin, Cheng-Han Ke, Yu-Chang Chiu, Yuan-Yu Lai, Yi-Chien Chen, Cheng-Rui Lu, Yu-Hsiang Fu, Chih-Chuan Huang

Abstract:

This work presents a 5T2C pixel circuit for active-matrix (AM) micro-displays in near-eye display applications. The circuit supports monochrome micro light-emitting diode (micro-LED) displays with ultrahigh resolution of 7056 pixels per inch (PPI). The circuit is designed and fabricated based on medium-voltage (MV) devices from the 55-nm high-voltage (HV) CMOS …

Published in: IEEE Solid-State Circuits Letters
Page(s): 89 – 92
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3667520
Publisher: IEEE

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A Sub-Threshold Oscillator-Based High-Accuracy Temperature Sensor With Tolerance to Supply Fluctuation and Device Aging

A Sub-Threshold Oscillator-Based High-Accuracy Temperature Sensor With Tolerance to Supply Fluctuation and Device Aging 150 150
Author(s): Wei Wang, Yumin Su, Shayok Dutta, Liwen Jiang, Zhiyu Chen, Zhanghao Yu, Caleb Kemere, Kaiyuan Yang

Abstract:

Accurate, low-power, and compact temperature sensors are demanded in a wide range of biomedical, environmental, and industrial sensing applications. This article presents an accurate and precise CMOS temperature sensor based on a sub-threshold ring oscillator (RO) in 180 nm. The sensing core employs a five-stage super cut-off contention-free (SCCF) delay cell …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 11
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3644747
Publisher: IEEE

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Energy-Efficient Logic-in-Memory and Neuromorphic Computing in Raised Source and Drain MOSFETs

Energy-Efficient Logic-in-Memory and Neuromorphic Computing in Raised Source and Drain MOSFETs 150 150
Author(s): Md. Hasan Raza Ansari, Bashayr Alqahtani, Naveen Kumar, Vihar Georgiev, Nazek El-Atab

Abstract:

This work highlights the potential application of raised source and drain (RSD) MOSFETs-based charge trapping memory (CTM) for next-generation computing applications. This simulation study presents a double-gate (DG)-RSD MOSFET technology with a short gate length (50 nm) to significantly improve the performance of logic-in-memory (LIM) and neuromorphic computing (NC) systems. …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 197 – 204
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3630217
Publisher: IEEE

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