low-dropout regulator (LDO)

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A Thermally Adaptive Ku-Band Array-Scalable Transmitter Incorporating VSWR-Resilient PA for Ground Terminal Phased-Array Applications

A Thermally Adaptive Ku-Band Array-Scalable Transmitter Incorporating VSWR-Resilient PA for Ground Terminal Phased-Array Applications 150 150
Author(s): Mohamed Eleraky, Alessandro Novello, Giorgio Cristiano, Basem Abdelaziz Abdelmagid, Yuqi Liu, Jianping Zeng, Jinglong Xu, Boce Lin, Jonas Nann, Hangxing Liu, Marco Saif, Niccolò Villaggi, Lavinia Recchioni, Tzu-Yuan Huang, Thomas Burger, Thomas Kleier, Hua Wang

Abstract:

This article presents an eight-channel dual-polarized Ku-band transmitter (Tx) beamformer integrated circuit (BFIC) fabricated in a 22-nm GlobalFoundries FDSOI process. Each channel integrates independent phase and gain control utilizing a 7-bit active phase shifter (PS) and a 5.5-bit attenuator (ATT). To mitigate performance degradation caused by load impedance variations in …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 19
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3727539
Publisher: IEEE

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A 6.9-ppm/°C, 0.66-mV/V Line Regulation, 50-mA Multi-Loop Low-Dropout Regulator With Integrated Single-BJT Voltage and Current References

A 6.9-ppm/°C, 0.66-mV/V Line Regulation, 50-mA Multi-Loop Low-Dropout Regulator With Integrated Single-BJT Voltage and Current References 150 150
Author(s): Raghav Bansal, Shouri Chatterjee

Abstract:

This article presents a fully integrated output-capacitor-less (OCL) multi-feedback-loop low-dropout regulator (LDO) with an in-built single bipolar junction transistor (BJT)-based voltage and current reference (VCR) for energy-harvesting Internet of Things (IoT) devices. The proposed architecture comprises four loops, which significantly enhance the DC regulation and transient performance of the …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 17
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3694415
Publisher: IEEE

View on IEEE Xplore

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