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miniSQI: A Compact and Low-Power SQIsign-1D Post-Quantum Digital Signature Verification Accelerator

miniSQI: A Compact and Low-Power SQIsign-1D Post-Quantum Digital Signature Verification Accelerator 150 150
Author(s): Krishna Sai Tarun Ramapragada, Utsav Banerjee

Abstract:

We present the first ASIC demonstration of SQIsign, an isogeny-based NIST-candidate post-quantum digital signature scheme. Our optimized Montgomery modular multiplier circuit design enables 2× speedup and energy savings, while efficient memory organization provides 31% area savings. We implement SQIsign-1D-Uncompressed signature verification in a small form factor with low power consumption suitable …

Published in: IEEE Solid-State Circuits Letters
Page(s): 1 – 1
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3720807
Publisher: IEEE

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A 54- $\\mu$ W Design-Agnostic Clock, Voltage, and EM-Pulse Fault-Injection Attack Detection Using Time-to-Voltage Conversion

A 54- $\\mu$ W Design-Agnostic Clock, Voltage, and EM-Pulse Fault-Injection Attack Detection Using Time-to-Voltage Conversion 150 150
Author(s): Yudhajit Ray, Archisman Ghosh, Sarthak Antal, Shreyas Sen

Abstract:

This article presents a state-of-the-art design-agnostic clock, voltage, and electromagnetic pulse (EMP)-based fault-injection attack (FIA) detector. The efficient conversion of time-to-voltage information by integrating amplifiers transforms the time anomaly into the voltage domain, enabling its detection at a lower power consumption. The clock-glitch detector design consumes only $53~\mu $ W …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3655593
Publisher: IEEE

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On-Chip Charge-Trap-Transistor-Based Mismatch Calibration of an 8-Bit Thermometer Current-Source DAC

On-Chip Charge-Trap-Transistor-Based Mismatch Calibration of an 8-Bit Thermometer Current-Source DAC 150 150
Author(s): Mohammadreza Zeinali, Sudhakar Pamarti

Abstract:

This letter presents an on-chip mismatch calibration technique for current-source digital-to-analog converters (DACs) using charge-trap transistors (CTTs) in 22-nm FDSOI technology. The proposed method exploits programmable threshold voltage (VTH) shifts in CTTs to locally tune the current of near-minimum-sized devices without external trimming. A compact 8-bit thermometer DAC is implemented …

Published in: IEEE Solid-State Circuits Letters
Page(s): 53 – 56
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3656261
Publisher: IEEE

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