Jitter

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An Ultra-Low-Jitter Sampling-Filter-Based Charge-Pump PLL With Resistive-Discharge Time-Amplifying Phase-Frequency Detector and Series-Resonance VCO

An Ultra-Low-Jitter Sampling-Filter-Based Charge-Pump PLL With Resistive-Discharge Time-Amplifying Phase-Frequency Detector and Series-Resonance VCO 150 150
Author(s): Feng Bu, Depeng Sun, Dingtao Zeng, Yuan Gao, Bowen Wang, Zhicheng Dong, Xiaoteng Zhao, Hao Xu, Na Yan, Ruixue Ding, Shubin Liu, Zhangming Zhu

Abstract:

This article presents a 13-GHz quadrature charge-pump phase-locked loop (CPPLL) that simultaneously achieves ultra-low jitter and low-spur performance. First, a low-noise resistive-discharge time-amplifying phase-frequency detector (RD-TAPFD) is proposed, achieving extremely low inherent noise and significantly suppressing noise from the following stages. Second, a sampling-based dual-path loop filter effectively suppresses reference …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 15
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3690771
Publisher: IEEE

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A Hybrid Touch Sensing AFE With Common-CVQ (Currents, Voltages, and Charges) Subtraction to Improve Display Noise Immunity for Large Sensing Load

A Hybrid Touch Sensing AFE With Common-CVQ (Currents, Voltages, and Charges) Subtraction to Improve Display Noise Immunity for Large Sensing Load 150 150
Author(s): Seung Hun Choi, Jun Yeol An, Jaewoong Ahn, Si-Woo Kim, Jae-Youl Lee, Yoon-Kyung Choi, Hyung-Min Lee

Abstract:

On-cell touch flexible organic light-emitting diode (OLED) displays face significant display noise (D-noise) challenges due to large parasitic capacitance ( $C_{P}$ ). To address the limitations of conventional methods, this article proposes improved common-current subtraction (CCS), incorporating common-voltage subtraction (CVS) and common-charge subtraction (CQS) techniques. CVS enhances signal-to-noise ratio (SNR) by …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3675678
Publisher: IEEE

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A Low Jitter and Low Spur Fractional-N Digital PLL Based on a DTC Chopping Technique

A Low Jitter and Low Spur Fractional-N Digital PLL Based on a DTC Chopping Technique 150 150
Author(s): Riccardo Moleri, Simone M. Dartizio, Michele Rossoni, Giacomo Castoro, Francesco Tesolin, Dmytro Cherniak, Carlo Samori, Andrea L. Lacaita, Salvatore Levantino

Abstract:

This work presents a digital-to-time converter (DTC)-based fractional-N digital phase-locked loop (PLL) designed to achieve simultaneously low jitter and low spurs. We introduce a novel DTC chopping technique that effectively mitigates fractional spurs, which we identify as predominantly arising from even-order nonlinearity invariable-slope (VS) DTCs. The proposed technique suppresses …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 17
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3663074
Publisher: IEEE

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A 60-GHz Low-Noise mmWave Divider-Less Fractional-N Cascaded PLL Achieving −250.2-dB FoMJ in 28-nm CMOS

A 60-GHz Low-Noise mmWave Divider-Less Fractional-N Cascaded PLL Achieving −250.2-dB FoMJ in 28-nm CMOS 150 150
Author(s): Jaehong Jung, Eunseok Lee, Donghyeon Han, Jinchen Wang, Anantha P. Chandrakasan, Ruonan Han

Abstract:

This article presents a fractional- ${ {N}}$ cascaded phase-locked loop (PLL) operating in the mmWave band from 55.8 to 64.2 GHz. The cascaded architecture consists of a first-stage fractional- ${ {N}}$ reference-sampling (RS) PLL and a second-stage sub-sampling (SS) PLL, incorporating two key innovations. The first-stage RS-PLL leverages a fully differential voltage-domain quantization-noise cancellation (…

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3652928
Publisher: IEEE

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A Low-Reference-Spur Injection-Locked Clock Multiplier Using Sub-Sampling Frequency Tracking Loop and Injection Pulse Timing Calibrator

A Low-Reference-Spur Injection-Locked Clock Multiplier Using Sub-Sampling Frequency Tracking Loop and Injection Pulse Timing Calibrator 150 150
Author(s): Hyeonjun Nam, Hyogyoung An, Changmin An, Sungjin Kim, Heein Yoon

Abstract:

This article presents an injection-locked clock multiplier (ILCM) achieving the low-reference spur (spur ${}_{\mathrm {REF}}$ ) with minimal overhead of a calibrator. To remove the dominant sources of frequency error, which are frequency drift ( $f_{\mathrm {DF}}$ ), phase offset ( $\varPhi _{\mathrm {OS}}$ ), and injection-induced phase error ( $\varPhi _{\mathrm {INJ}}$ ), the ILCM …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 11
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3650135
Publisher: IEEE

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A 19.4-fsRMS Jitter 0.1-to-44-GHz Cryo-CMOS Fractional-N CP-PLL Featuring Automatic Bleed Calibration for Quantum Computing

A 19.4-fsRMS Jitter 0.1-to-44-GHz Cryo-CMOS Fractional-N CP-PLL Featuring Automatic Bleed Calibration for Quantum Computing 150 150
Author(s): Jinhai Xiao, Yong Chen, Ningyi Zhang, Xiaolong Liu, Rui Liu, Junao Zhu, Chenghao Zhang, Peng Luo, Maliang Liu, Yintang Yang, Xiaohua Ma, Yue Hao

Abstract:

Cryogenic fractional- $N$ phase-locked loops (PLLs) are essential for large-scale superconducting quantum computing, and serve as integrated pump sources for Josephson parametric amplifiers. These PLLs enable high-fidelity qubit readout while reducing the thermal load and wiring complexity associated with room-temperature generators. However, the cryogenic pump sources developed thus far were …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 19
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3653994
Publisher: IEEE

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A 39.4-mW 300 MHz-BW 70.9 dB-SNDR Hybrid ADC With Resistive Input and 200 fs, rms-Jitter Tolerance

A 39.4-mW 300 MHz-BW 70.9 dB-SNDR Hybrid ADC With Resistive Input and 200 fs, rms-Jitter Tolerance 150 150
Author(s): Yanquan Luo, Mingtao Zhan, Yi Zhong, Nan Sun

Abstract:

This letter presents a power-efficient hybrid ADC architecture: a low-resolution continuous-time (CT) delta-sigma modulator (DSM) followed by a time-interleaved pipeline stage which further quantizes the quantization noise of the DSM. In the frontend CT DSM, the resistive input makes the ADC easy-to-drive, and the direct-charge-dump feedback (DCD FB) provides a …

Published in: IEEE Solid-State Circuits Letters
Page(s): 61 – 64
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3656180
Publisher: IEEE

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A 94-fs Jitter and −249.3-dB FoM MDLL With Background Calibration of Injection Phase and Slew-Rate Mismatch

A 94-fs Jitter and −249.3-dB FoM MDLL With Background Calibration of Injection Phase and Slew-Rate Mismatch 150 150
Author(s): Dongjun Park, Jae-Yoon Sim, Seon-Kyoo Lee

Abstract:

This article presents a ring oscillator (RO)-based multiplying delay-locked loop (MDLL) that incorporates a dual-background calibration scheme to compensate for both injection phase and slew-rate mismatches. The MDLL employs the proposed frequency/slew-rate detector (FSD) to distinguish both mismatch types by comparing the pulse widths of consecutive output clock …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3648361
Publisher: IEEE

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A Ring-Oscillator-Based Digital Harmonic-Mixing Fractional-N PLL

A Ring-Oscillator-Based Digital Harmonic-Mixing Fractional-N PLL 150 150
Author(s): Hongyu Lu, Nader Fathy, Patrick P. Mercier

Abstract:

This letter presents a low-jitter digital harmonic-mixing fractional- $N$ phase-locked loop (PLL) using a ring oscillator. To extend the loop bandwidth, a mixer with unity gain in the phase domain is adopted, which helps suppress phase noise of the phase detector and delta-sigma modulator. Furthermore, to reduce mixing harmonics that …

Published in: IEEE Solid-State Circuits Letters
Page(s): 57 – 60
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3654239
Publisher: IEEE

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