A 10.1-ENOB 8kHz Bandwidth 95–250nW PVT-Robust DT Level-Crossing ADC for Sparse and Generic Signals https://sscs.ieee.org/wp-content/themes/movedo/images/empty/thumbnail.jpg 150 150 https://secure.gravatar.com/avatar/8fcdccb598784519a6037b6f80b02dee03caa773fc8d223c13bfce179d70f915?s=96&d=mm&r=g
Abstract:
This article presents an event-driven discrete-time level crossing analog-to-digital converter (DT-LCADC) that is energy-efficient in converting both sparse and generic signals and is robust against process voltage and temperature (PVT) variations. The proposed DT-LCADC uses the comparator delay to classify each level-crossing event as slow (produced by a small input …