Smart Write Algorithm to Enhance Performances and Reliability of an RRAM Macro https://sscs.ieee.org/wp-content/themes/movedo/images/empty/thumbnail.jpg 150 150 https://secure.gravatar.com/avatar/8935a7dcd6741d8e23d45bb15c1470a8?s=96&d=mm&r=g
Abstract:
This article presents a comprehensive assessment of the impact of various design assist techniques on the inherent performance and reliability of native resistive RAM (RRAM) on silicon. The collaborative optimization of design and technology plays a crucial role in replacing conventional flash memory as the leading solution. We showcase that …