Entropy

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Design and analysis of a three-stream STT-MTJ TRNG with XOR and Majority Voter logic as post processing Architectures

Design and analysis of a three-stream STT-MTJ TRNG with XOR and Majority Voter logic as post processing Architectures 150 150
Author(s): M.Satwik Rai, Akshaja Kanugovi, Vinod Kumar Joshi

Abstract:

True Random Number Generators (TRNGs) are critical for hardware security, providing unpredictable entropy for cryptographic applications. Spin-Transfer Torque Magnetic Tunnel Junction (STT-MTJ) devices offer a promising entropy source due to their low power consumption, non-volatility, and stochastic switching behavior. This work presents a MTJ-based TRNG which produces three independent bit …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 1 – 1
Year of Publication: 2026
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2026.3671608
Publisher: IEEE

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A 168 nW to 44.3 Mb/s Adaptable TRNG With 400 mV Attack-Resilient Hybrid RO Core

A 168 nW to 44.3 Mb/s Adaptable TRNG With 400 mV Attack-Resilient Hybrid RO Core 150 150
Author(s): Berkay Özbek, Timothy G. Constandinou

Abstract:

This letter presents an adaptable ring oscillator (RO)-true random number generator (TRNG) that removes the fixed power–throughput tradeoff by selecting delay-cell physics at run time. A hybrid core uses a current-starved inverter in low-power (LP) mode to amplify slew-limited jitter for high bit-efficiency at low frequency, and a …

Published in: IEEE Solid-State Circuits Letters
Page(s): 325 – 328
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3621413
Publisher: IEEE

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High-Entropy Analog-Based Strong Physical Unclonable Function With Area-to-Entropy-ratio of 166 F2/bit

High-Entropy Analog-Based Strong Physical Unclonable Function With Area-to-Entropy-ratio of 166 F2/bit 150 150
Author(s): Alessandro Catania, Sebastiano Strangio, Maksym Paliy, Christian Sbrana, Michele Bertozzi, Giuseppe Iannaccone

Abstract:

In this letter, we present a high-entropy strong physically unclonable function (PUF) utilizing weak-inversion current mirrors implemented in a standard 65-nm CMOS technology. Each response bit of the proposed PUF relies on the threshold voltage differences of minimum-sized transistors arranged in a $32\times 32$ matrix. The analog operating principle enables encoding …

Published in: IEEE Solid-State Circuits Letters
Page(s): 309 – 312
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3616263
Publisher: IEEE

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A 38.1 fJ/Bit Capacitive-Latch True Random Number Generator Featuring Both Autozeroed Inverter Mismatch and Accelerated Evaluation

A 38.1 fJ/Bit Capacitive-Latch True Random Number Generator Featuring Both Autozeroed Inverter Mismatch and Accelerated Evaluation 150 150
Author(s): Woojin Lee, Changmin Sim, Changjoo Kim, Jinwoo Jeon, Hyundo Jung, Taihyun Kim, Chulwoo Kim

Abstract:

This work presents a capacitive-latch (C-latch) true random number generator (TRNG) that achieves both inverter mismatch autozeroing and accelerated evaluation by utilizing coupling capacitors. The proposed C-latch TRNG samples the mismatch between inverter equalization voltages through coupling capacitors during the equalization phase, effectively autozeroing inverter mismatch and enabling high-entropy raw …

Published in: IEEE Solid-State Circuits Letters
Page(s): 265 – 268
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3608187
Publisher: IEEE

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24.86 Gb/s Full-Digital Chaos Random Number 1.53 GSamples/s Noise Generator in 40nm CMOS

24.86 Gb/s Full-Digital Chaos Random Number 1.53 GSamples/s Noise Generator in 40nm CMOS 150 150
Author(s): Cheng-Bin Chen, Tsung Chen, Yuan-Hao Huang

Abstract:

This letter presents a fully digital true random number generator (TRNG) and noise generator (NG) based on a chaos system. We design the chaos random number generator (CRNG) using the proposed Euler-based modified Lorenz system with periodic perturbation and modified modulo unit. The chaos NG (CNG) processor integrates the CRNG …

Published in: IEEE Solid-State Circuits Letters
Page(s): 253 – 256
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3605369
Publisher: IEEE

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