Electric potential

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Integrating Atomistic Insights With Circuit Simulations via Transformer-Driven Symbolic Regression

Integrating Atomistic Insights With Circuit Simulations via Transformer-Driven Symbolic Regression 150 150
Author(s): Md Rahatul Islam Udoy, Jack Hutchins, Shamiul Alam, Catherine Schuman, Ahmedullah Aziz

Abstract:

This article introduces a framework that establishes a cohesive link between the first principles-based simulations and circuit-level analyses using a machine learning-based compact modeling platform. Starting with atomistic simulations, the framework examines the microscopic details of material behavior, forming the foundation for later stages. The generated datasets, with molecular insights, …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 179 – 187
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3624662
Publisher: IEEE

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Device Nonideality-Aware Compute-in-Memory Array Architecting: Direct Voltage Sensing, I–V Symmetric Bitcell, and Padding Array

Device Nonideality-Aware Compute-in-Memory Array Architecting: Direct Voltage Sensing, I–V Symmetric Bitcell, and Padding Array 150 150
Author(s): Jianzi Jin, Shifan Gao, Cimang Lu, Xiang Qiu, Yi Zhao

Abstract:

A voltage sensing compute-in-memory (CIM) architecture has been designed to improve the analog computing accuracy, and a chip on 90-nm flash platform has been successfully fabricated, with the bidirectional operation enabled by the symmetric bitcell structure. By padding the weight sum to a global value for all bit lines (BLs), …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 19 – 24
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3539470
Publisher: IEEE

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