Capacitance measurement

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A MEMS-Free 4096-Pixel CMOS E-Nose Array With MOF-Based Molecular Selectivity, In-Pixel Thermal Regeneration, and a Compact Single-Coefficient Bandpass Sigma–Delta ADC

A MEMS-Free 4096-Pixel CMOS E-Nose Array With MOF-Based Molecular Selectivity, In-Pixel Thermal Regeneration, and a Compact Single-Coefficient Bandpass Sigma–Delta ADC 150 150
Author(s): Marco Saif, Adam Y. Wang, Shao-Wei Lo, Fuze Jiang, Zhikai Huang, Jiachen Wang, Hangxing Liu, Chih-Jen Shih, Thomas Burger, Hua Wang

Abstract:

This work presents a CMOS-only [micro-electromechanical systems (MEMS)-free] electronic nose (e-nose) for concurrent multi-gas-sensing applications. The proposed system integrates 4096 capacitance-to-digital converter (CDC) pixels, each implementing a compact bandpass sigma–delta ( $\Sigma \Delta $ ) ADC with a single feedback coefficient and no additional feedforward or feedback paths, achieving each pixel footprint …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3685410
Publisher: IEEE

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Design and Verification of Low Parasitic MOS Capacitors With Series Connected Tri-Well Junctions

Design and Verification of Low Parasitic MOS Capacitors With Series Connected Tri-Well Junctions 150 150
Author(s): Zhendong Li, Yongjuan Shi, Yifan Jiang, Chen Hu, Junting Chen, Mengyuan Hua, Xun Liu, Junmin Jiang

Abstract:

This letter presents a tri-well implementation of MOS capacitors designed to tackle the challenge of high parasitic capacitance. By serially connecting the three parasitic well junction capacitors between the three wells (N-Well, deep P-Well, and deep N-Well) and substrate (PSUB), the parasitic capacitance can be significantly decreased. A higher bias …

Published in: IEEE Solid-State Circuits Letters
Page(s): 277 – 280
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3608282
Publisher: IEEE

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