Calibration

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On-Chip Charge-Trap-Transistor-Based Mismatch Calibration of an 8-Bit Thermometer Current-Source DAC

On-Chip Charge-Trap-Transistor-Based Mismatch Calibration of an 8-Bit Thermometer Current-Source DAC 150 150
Author(s): Mohammadreza Zeinali, Sudhakar Pamarti

Abstract:

This letter presents an on-chip mismatch calibration technique for current-source digital-to-analog converters (DACs) using charge-trap transistors (CTTs) in 22-nm FDSOI technology. The proposed method exploits programmable threshold voltage (VTH) shifts in CTTs to locally tune the current of near-minimum-sized devices without external trimming. A compact 8-bit thermometer DAC is implemented …

Published in: IEEE Solid-State Circuits Letters
Page(s): 53 – 56
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3656261
Publisher: IEEE

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A 94-fs Jitter and −249.3-dB FoM MDLL With Background Calibration of Injection Phase and Slew-Rate Mismatch

A 94-fs Jitter and −249.3-dB FoM MDLL With Background Calibration of Injection Phase and Slew-Rate Mismatch 150 150
Author(s): Dongjun Park, Jae-Yoon Sim, Seon-Kyoo Lee

Abstract:

This article presents a ring oscillator (RO)-based multiplying delay-locked loop (MDLL) that incorporates a dual-background calibration scheme to compensate for both injection phase and slew-rate mismatches. The MDLL employs the proposed frequency/slew-rate detector (FSD) to distinguish both mismatch types by comparing the pulse widths of consecutive output clock …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3648361
Publisher: IEEE

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A Sub-Threshold Oscillator-Based High-Accuracy Temperature Sensor With Tolerance to Supply Fluctuation and Device Aging

A Sub-Threshold Oscillator-Based High-Accuracy Temperature Sensor With Tolerance to Supply Fluctuation and Device Aging 150 150
Author(s): Wei Wang, Yumin Su, Shayok Dutta, Liwen Jiang, Zhiyu Chen, Zhanghao Yu, Caleb Kemere, Kaiyuan Yang

Abstract:

Accurate, low-power, and compact temperature sensors are demanded in a wide range of biomedical, environmental, and industrial sensing applications. This article presents an accurate and precise CMOS temperature sensor based on a sub-threshold ring oscillator (RO) in 180 nm. The sensing core employs a five-stage super cut-off contention-free (SCCF) delay cell …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 11
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3644747
Publisher: IEEE

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A Ring-Oscillator-Based Digital Harmonic-Mixing Fractional-N PLL

A Ring-Oscillator-Based Digital Harmonic-Mixing Fractional-N PLL 150 150
Author(s): Hongyu Lu, Nader Fathy, Patrick P. Mercier

Abstract:

This letter presents a low-jitter digital harmonic-mixing fractional- $N$ phase-locked loop (PLL) using a ring oscillator. To extend the loop bandwidth, a mixer with unity gain in the phase domain is adopted, which helps suppress phase noise of the phase detector and delta-sigma modulator. Furthermore, to reduce mixing harmonics that …

Published in: IEEE Solid-State Circuits Letters
Page(s): 57 – 60
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2026.3654239
Publisher: IEEE

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A 500 MS/s Robust 2b/cycle Pipelined-SAR ADC Achieving 64.6-dB SNDR and 82.6-dB SFDR With Linearity Enhancement Techniques

A 500 MS/s Robust 2b/cycle Pipelined-SAR ADC Achieving 64.6-dB SNDR and 82.6-dB SFDR With Linearity Enhancement Techniques 150 150
Author(s): Qiang Yu, Zheng Zhu, Lulu Zhang, Qin Huang, Yao Feng, Chao Liang, Biao Hu, Ling Du, Rongbin Yang, Shuangyi Wu, Qiang Li

Abstract:

This letter presents a 14-bit 500-MS/s 3-stage pipelined successive approximation register (SAR) analog-to-digital converter (ADC). By exploiting robust 2b/cycle SAR ADCs, this ADC incorporates significant voltage and time redundancy. High SFDR is achieved through several linearity enhancement techniques. First, a DAC splitting technique addresses the common-mode voltage matching …

Published in: IEEE Solid-State Circuits Letters
Page(s): 9 – 12
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3639322
Publisher: IEEE

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A Calibration-Free Pipelined-SAR ADC With Cross-Stage Gain-Mismatch Error Shaping and Inherent Noise Shaping

A Calibration-Free Pipelined-SAR ADC With Cross-Stage Gain-Mismatch Error Shaping and Inherent Noise Shaping 150 150
Author(s): Jihang Gao, Yaohui Luan, Siyuan Ye, Jiajia Cui, Xinhang Xu, Linxiao Shen

Abstract:

This article presents a calibration-free pipelined-successive-approximation-register (SAR) analog-to-digital converter (ADC) based on the proposed cross-stage gain-mismatch-error shaping (CS-GMES) mechanism. The CS-GMES is realized by including the entire 2nd stage into MES operation to unify the gain error and the 2nd-stage mismatch error. A feedback capacitor provides cross-stage connection and mismatch …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3624412
Publisher: IEEE

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A 560 μ W, 6 fA/√Hz, 146 dB-DR Ultrasensitive Current Readout Circuit for PWM-Dimming-Tolerant Under-Display Ambient Light Sensors

A 560 μ W, 6 fA/√Hz, 146 dB-DR Ultrasensitive Current Readout Circuit for PWM-Dimming-Tolerant Under-Display Ambient Light Sensors 150 150
Author(s): Xiuzhi Zhao, Liheng Liu, Shi Chen, Tianxiang Qu, Qinjing Pan, Dan Li, Gan Guo, Zhiliang Hong, Jiawei Xu

Abstract:

This letter presents an ultralow-noise, power-efficient, and pulse-width modulation (PWM)-dimming-tolerant photocurrent readout circuit for under-display ambient light sensor (ALS). A transimpedance amplifier (TIA) with a feedback diode achieves G $\Omega $ -level resistance and 6 fA/ $\surd $ Hz input current noise, enabling sub-pA resolution. Instability and noise folding are mitigated at …

Published in: IEEE Solid-State Circuits Letters
Page(s): 361 – 364
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3626378
Publisher: IEEE

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An 8-Bit 400-MS/s 1-Then-2-Bit/Cycle SAR ADC With Comparator Rotation-Based Input-Independent Background Offset Calibration

An 8-Bit 400-MS/s 1-Then-2-Bit/Cycle SAR ADC With Comparator Rotation-Based Input-Independent Background Offset Calibration 150 150
Author(s): Changjoo Kim, Sooho Park, Yohan Choi, Minkyun Shim, Woojin Lee, Donghwi Seo, Chulwoo Kim

Abstract:

This letter presents an 8-bit 400 MS/s 1-then-2-bit/cycle successive approximation register (SAR) analog-to-digital converter (ADC) employing a comparator rotation-based background offset calibration (CRBC) technique. Unlike conventional 1-then-2-bit/cycle architectures, where calibration validity depends on the input voltage, the proposed comparator rotation-based background calibration enables input-independent background calibration, …

Published in: IEEE Solid-State Circuits Letters
Page(s): 345 – 348
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3624263
Publisher: IEEE

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A Wideband Calibration-Free D-Band Passive Phase Shifter With Frequency-Invariant Codes Over 24% Fractional Bandwidth

A Wideband Calibration-Free D-Band Passive Phase Shifter With Frequency-Invariant Codes Over 24% Fractional Bandwidth 150 150
Author(s): Basem Abdelaziz Abdelmagid, Yuqi Liu, Hua Wang

Abstract:

This work presents a compact 110–140 GHz bidirectional D-band passive phase shifter based on combining a 5-stage capacitively-loaded reflective-type PS (RTPS) with a wideband 0°/180° stage. The design achieves a 360° phase range with a resolution of 11.25°. By applying: 1) a wideband RTPS design methodology on the stage level; 2) frequency/switching-staggering techniques among the …

Published in: IEEE Solid-State Circuits Letters
Page(s): 329 – 332
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3622233
Publisher: IEEE

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