Benchmark testing

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Beyond Backside Power: Backside Signal Routing as Technology Booster for Standard-Cell Scaling

Beyond Backside Power: Backside Signal Routing as Technology Booster for Standard-Cell Scaling 150 150
Author(s): Anup Ashok Kedilaya, Sirish Oruganti, Nishant Gupta, Xiuhao Zhang, Ilya Karpov, Mark A. Anders, Jaydeep P. Kulkarni

Abstract:

Advances in process technology enabling backside metals (BSMs) and contacts offer new design–technology co-optimization (DTCO) opportunities to further enhance power, performance, and area gains (PPA) in sub-3-nm nodes. This work exploits backside (BS) contact technology within standard cells to extend both signal and clock routing to BSM layers, …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 107 – 115
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3617784
Publisher: IEEE

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A Benchmark of Cryo-CMOS Dynamic Comparators in a 40 nm Bulk CMOS Technology

A Benchmark of Cryo-CMOS Dynamic Comparators in a 40 nm Bulk CMOS Technology 150 150
Author(s): Bram Veraverbeke, Filip Tavernier

Abstract:

All cryo-CMOS quantum-classical control interfaces require an analog-to-digital converter (ADC) bridging the analog qubits and the digital control logic. Dynamic comparators play a crucial role in the precision, speed, and power consumption of these ADCs. Yet, their performance is severely impacted by the cryogenic environment. Therefore, this letter benchmarks, for …

Published in: IEEE Solid-State Circuits Letters
Page(s): 317 – 320
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3618161
Publisher: IEEE

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Opal: A 16-nm Coarse-Grained Reconfigurable Array SoC for Full Sparse Machine Learning Applications

Opal: A 16-nm Coarse-Grained Reconfigurable Array SoC for Full Sparse Machine Learning Applications 150 150
Author(s): Po-Han Chen, Bo Wun Cheng, Michael Oduoza, Zhouhua Xie, Rupert Lu, Sai Gautham Ravipati, Kalhan Koul, Alex Carsello, Yuchen Mei, Mark Horowitz, Priyanka Raina

Abstract:

Sparsity has recently attracted increased attention in the machine learning (ML) community due to its potential to improve performance and energy efficiency by eliminating ineffectual computations. As ML models evolve rapidly, reconfigurable architectures, such as coarse-grained reconfigurable arrays (CGRAs), are being explored to adapt to and accelerate emerging models. Previous …

Published in: IEEE Solid-State Circuits Letters
Page(s): 293 – 296
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3613245
Publisher: IEEE

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A Unified Early-Warning AVFS Design With Path Activation-Aware Monitoring Point Optimization

A Unified Early-Warning AVFS Design With Path Activation-Aware Monitoring Point Optimization 150 150
Author(s): Cai Li, Kaize Zhou, Junyi Qian, Haochang Zhi, Weiwei Shan

Abstract:

This work proposes a unified early-warning adaptive voltage-frequency scaling (AVFS) system that offers a practical low-power solution for commercial IoT devices. First, a path activation-aware monitoring point optimization strategy is proposed to mitigate the risk of illegal voltage scaling. The strategy combines the path activation evaluation with the required timing …

Published in: IEEE Solid-State Circuits Letters
Page(s): 229 – 232
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3593960
Publisher: IEEE

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