Background calibration

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A Wideband Digitally Assisted Frequency Tripler With Adaptively Optimized Output Power in 55-nm SiGe BiCMOS

A Wideband Digitally Assisted Frequency Tripler With Adaptively Optimized Output Power in 55-nm SiGe BiCMOS 150 150
Author(s): Daniele Lodi Rizzini, Francesco Tesolin, Michele Rossoni, Riccardo Moleri, Filippo Osio, Andrea Mazzanti, Andrea L. Lacaita, Simone M. Dartizio, Salvatore Levantino

Abstract:

This article presents a 28–38-GHz frequency tripler implemented in 55-nm SiGe BiCMOS technology with a novel on-chip background calibration technique. This technique continuously optimizes the circuit performance by maximizing output power and improving fundamental harmonic rejection. The proposed tripler achieves wideband operation and robust performance across varying operating conditions and …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1844 – 1859
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3666591
Publisher: IEEE

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A 12-bit 1-GS/s Current-Steering DAC With Paired Current Source Switching Background Mismatch Calibration

A 12-bit 1-GS/s Current-Steering DAC With Paired Current Source Switching Background Mismatch Calibration 150 150
Author(s): Chang-Un Park, Jae-Hyun Chung, Chunsuk Kim, Hyun-Woo Shin, Charlie Tahar, Seung-Tak Ryu

Abstract:

This article presents a spur-suppressed background calibration technique for high-speed current-steering digital-to-analog converters (DACs), based on a paired current source (CS) switching scheme. In conventional background calibration, periodic switching of CSs to and from the calibration mode introduces unwanted glitches that appear as spurious tones. The proposed technique introduces an …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 11
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3668788
Publisher: IEEE

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