Abstract:
This article presents DRAMP—the first silicon-verified, fully parallel one-transistor–one-capacitor (1T1C) dynamic random access memory (DRAM) compute-in-memory (CIM) macro for high computational density and energy efficiency. The key enabling technique is a word-line (WL) ramp-charging operation. By applying a constant-slope ramp and periodic pulses to the WLs, the …