An Investigation of Minimum Supply Voltage of 5-nm SRAM From 300 K Down to 10 K https://sscs.ieee.org/wp-content/themes/movedo/images/empty/thumbnail.jpg 150 150 https://secure.gravatar.com/avatar/8fcdccb598784519a6037b6f80b02dee03caa773fc8d223c13bfce179d70f915?s=96&d=mm&r=g
Abstract:
In this article, we present a comprehensive study of the impact of cryogenic temperatures on the minimum operating voltage ( $V_{min }$ ) of 5-nm Fin Field-Effect Transistors (FinFETs)-based Static Random Access Memory (SRAM) cells. To perform the SRAM $V_{min }$ evaluation, we have measured the FinFETs fabricated using a commercial 5…