IEEE Solid-State Circuits Magazine
R. Jacob Baker
Editor-In-Chief
SSC Magazine
Rakesh Kumar
Chair of SSC Magazine Advisory Board
Launched in 2009, each issue of the IEEE Solid-State Circuits Magazine is envisioned as a self-contained resource for fundamental theories and practical advances within the field of Integrated Circuits (ICs).
Written at a tutorial level and in an informal style, the Magazine features articles on technical milestones, current trends and future developments by leaders from industry, academia and government, and is a one-stop shop for news about people and events in the global IC world.
Archived issues of the SSCS Newsletter may be found on the SSCS About Us/History webpage:
The Solid-State Circuits Magazine is hosted in IEEEXplore allowing
- articles to be found with searches through Xplore and Google Scholar,
- free access to SSCS Members. Use your IEEE Web account to logon when asked.
Join the SSCS and receive the Solid-State Circuits Magazine quarterly by mail, free of charge
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Information for Potential Authors:
- For suggestions of topics on important fundamentals in the advancement of integrated or subject matter experts to recommend as feature authors, provide your ideas to Jake Baker, Editor-in-chief of the Magazine.
- To contribute news articles about noteworthy people and places, please provide your ideas to Abira Sengupta, Magazine News Editor.
Latest Issue
- Society Listing
- [Contributors]
- Welcome to the Summer 2018 Issue of IEEE Solid-State Circuits Magazine! [Editor's Note]
- Summer Reflections [President's Corner]
- What's in a Name? [Associate Editor's View]
- Thevenin and Norton Equivalent Circuits: Part 2 [Circuit Intuitions]
- The Delay-Locked Loop [A Circuit for All Seasons]
- Adaptive and Resilient Circuits: A Tutorial on Improving Processor Performance, Energy Efficiency, and Yield via Dynamic Variation
- Single-Photon Avalanche Diode-Based Detection and Imaging: Bringing the Photodiode Out of Its Comfort Zone
- Analog-to-Digital Converter-Based Serial Links: An Overview
- Biasing for Zero Distortion: Using the EKV/BSIM6 Expressions
- An Overview of 5G Requirements and Future Wireless Networks: Accommodating Scaling Technology
- Calibration and Dynamic Matching in Data Converters: Part 2: Time-Interleaved Analog-to-Digital Converters and Background-Calibration Challenges
- IEEE SSCS Japan Chapter Hosts DL Prof. Hyeon-Min Bae [Chapters]
- SSCS DL Jeyanandh Paramesh Visits IEEE SSCS Utah Chapter [Chapters]
- IEEE SSCS Benelux Chapter Organizes Its Third Workshop at Katholieke Universiteit Leuven [Chapters]
- IEEE SSCS-USTC Student Chapter Participated in the Hefei Integrated Circuits Technology Museum Opening [Chapters]
- IEEE SSCS Hong Kong Student Chapter Activities [Chapters]
- IEEE SSCS Kansai Chapter Holds Technical Seminar [Chapters]
- Recent IEEE Silicon Valley SSCS Chapter Activities: Seminars, Workshops, and Distinguished Lecturer Talks [Chapters]