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Guest Editorial 2024 Custom Integrated Circuits Conference

Guest Editorial 2024 Custom Integrated Circuits Conference 150 150
Author(s): Taiyun Chi, Yoonmyung Lee, Shaolan Li

Abstract:

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Published in: IEEE Journal of Solid-State Circuits
Page(s): 752 – 754
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3526861
Publisher: IEEE

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Guest Editorial 2024 Custom Integrated Circuits Conference

Guest Editorial 2024 Custom Integrated Circuits Conference 150 150
Author(s): Taiyun Chi, Yoonmyung Lee, Shaolan Li

Abstract:

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Published in: IEEE Journal of Solid-State Circuits
Page(s): 752 – 754
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3526861
Publisher: IEEE

View on IEEE Xplore

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Guest Editorial 2024 Custom Integrated Circuits Conference

Guest Editorial 2024 Custom Integrated Circuits Conference 150 150
Author(s): Taiyun Chi, Yoonmyung Lee, Shaolan Li

Abstract:

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Published in: IEEE Journal of Solid-State Circuits
Page(s): 752 – 754
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3526861
Publisher: IEEE

View on IEEE Xplore

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Guest Editorial 2024 Custom Integrated Circuits Conference

Guest Editorial 2024 Custom Integrated Circuits Conference 150 150
Author(s): Taiyun Chi, Yoonmyung Lee, Shaolan Li

Abstract:

Warning: Undefined property: stdClass::$abstract in /nas/content/live/ieeesscs/wp-content/themes/movedo-child/xplore-api/xplore-article-content.php on line 13

Published in: IEEE Journal of Solid-State Circuits
Page(s): 752 – 754
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3526861
Publisher: IEEE

View on IEEE Xplore

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All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection

All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection 150 150
Author(s): Houk Lee, Jinpyo Han, Junhee Cho, Heesung Lee, Jung-Hoon Chun, Seong-Jin Kim, Jaehyuk Choi

Abstract:

This article presents an all-digital event-based vision sensor (EVS) using single-photon avalanche diode (SPAD) pixels. The proposed sensor introduces a multi-event generation method that enables the detection of light intensity changes across multiple levels, facilitating advanced event-image processing techniques. The three core processing techniques implemented are event-driven threshold control (EDTC), …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1162 – 1173
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3536184
Publisher: IEEE

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All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection

All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection 150 150
Author(s): Houk Lee, Jinpyo Han, Junhee Cho, Heesung Lee, Jung-Hoon Chun, Seong-Jin Kim, Jaehyuk Choi

Abstract:

This article presents an all-digital event-based vision sensor (EVS) using single-photon avalanche diode (SPAD) pixels. The proposed sensor introduces a multi-event generation method that enables the detection of light intensity changes across multiple levels, facilitating advanced event-image processing techniques. The three core processing techniques implemented are event-driven threshold control (EDTC), …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1162 – 1173
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3536184
Publisher: IEEE

View on IEEE Xplore

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All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection

All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection 150 150
Author(s): Houk Lee, Jinpyo Han, Junhee Cho, Heesung Lee, Jung-Hoon Chun, Seong-Jin Kim, Jaehyuk Choi

Abstract:

This article presents an all-digital event-based vision sensor (EVS) using single-photon avalanche diode (SPAD) pixels. The proposed sensor introduces a multi-event generation method that enables the detection of light intensity changes across multiple levels, facilitating advanced event-image processing techniques. The three core processing techniques implemented are event-driven threshold control (EDTC), …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1162 – 1173
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3536184
Publisher: IEEE

View on IEEE Xplore

  • No Comments

All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection

All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection 150 150
Author(s): Houk Lee, Jinpyo Han, Junhee Cho, Heesung Lee, Jung-Hoon Chun, Seong-Jin Kim, Jaehyuk Choi

Abstract:

This article presents an all-digital event-based vision sensor (EVS) using single-photon avalanche diode (SPAD) pixels. The proposed sensor introduces a multi-event generation method that enables the detection of light intensity changes across multiple levels, facilitating advanced event-image processing techniques. The three core processing techniques implemented are event-driven threshold control (EDTC), …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1162 – 1173
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3536184
Publisher: IEEE

View on IEEE Xplore

  • No Comments

All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection

All-Digital Event-Based Vision Sensor With Multi-Event Generation for Motion/Vibration-Adaptive Detection 150 150
Author(s): Houk Lee, Jinpyo Han, Junhee Cho, Heesung Lee, Jung-Hoon Chun, Seong-Jin Kim, Jaehyuk Choi

Abstract:

This article presents an all-digital event-based vision sensor (EVS) using single-photon avalanche diode (SPAD) pixels. The proposed sensor introduces a multi-event generation method that enables the detection of light intensity changes across multiple levels, facilitating advanced event-image processing techniques. The three core processing techniques implemented are event-driven threshold control (EDTC), …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1162 – 1173
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3536184
Publisher: IEEE

View on IEEE Xplore

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