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An 11.95-ENOB 560-MS/s Amplifier-Switching Subranging Analog-to-Digital Converter With Multi-Threshold Comparators

An 11.95-ENOB 560-MS/s Amplifier-Switching Subranging Analog-to-Digital Converter With Multi-Threshold Comparators 150 150
Author(s): Ritaro Takenaka, Tetsuya Iizuka

Abstract:

This article proposes a 14-bit, 560-MS/s subranging analog-to-digital converter (ADC) that employs an amplifier-switching architecture with multi-threshold comparators. The proposed amplifier-switching architecture reuses a flash quantizer multiple times during subranging conversion by amplifying the residue voltage with an appropriate gain at each quantization step. This approach reduces the required …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 14
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3647024
Publisher: IEEE

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A High-Speed D-FF and a 11-Bit Up-Down Counter Using Unipolar Oxide TFTs on a Flexible Foil

A High-Speed D-FF and a 11-Bit Up-Down Counter Using Unipolar Oxide TFTs on a Flexible Foil 150 150
Author(s): Suyash Shrivastava, Pydi Ganga Bahubalindruni

Abstract:

This manuscript presents an experimental characterization of a novel high speed D flip-flop (D-FF). The circuit was fabricated on a $27\mu $ m thick flexible polyimide substrate using a nMOS only, single gate amorphous Indium-Gallium-Zinc-Oxide (a-IGZO) thin-film transistor (TFT) technology. Reliable response of the D-FF was noticed from measurements up to …

Published in: IEEE Solid-State Circuits Letters
Page(s): 373 – 376
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3636192
Publisher: IEEE

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A Benchmark of Cryo-CMOS Dynamic Comparators in a 40 nm Bulk CMOS Technology

A Benchmark of Cryo-CMOS Dynamic Comparators in a 40 nm Bulk CMOS Technology 150 150
Author(s): Bram Veraverbeke, Filip Tavernier

Abstract:

All cryo-CMOS quantum-classical control interfaces require an analog-to-digital converter (ADC) bridging the analog qubits and the digital control logic. Dynamic comparators play a crucial role in the precision, speed, and power consumption of these ADCs. Yet, their performance is severely impacted by the cryogenic environment. Therefore, this letter benchmarks, for …

Published in: IEEE Solid-State Circuits Letters
Page(s): 317 – 320
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3618161
Publisher: IEEE

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Ultra-Low-Power Dynamic-Bias Comparators With Self-Clocked Latch in 65-nm CMOS

Ultra-Low-Power Dynamic-Bias Comparators With Self-Clocked Latch in 65-nm CMOS 150 150
Author(s): Anojh Kumaran Rajendra, Harijot Singh Bindra, Bram Nauta

Abstract:

This article introduces two comparators featuring a dynamic-bias preamplifier and self-clocked latches, tailored for ultra-low-power and medium-speed applications with <500- $\mu $ V input-referred noise (IRN). The proposed self-clocked latches are activated by the preamplifier outputs and therefore operate with a lower common-mode current, which in turn minimizes the crowbar current …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3612157
Publisher: IEEE

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A 38.1 fJ/Bit Capacitive-Latch True Random Number Generator Featuring Both Autozeroed Inverter Mismatch and Accelerated Evaluation

A 38.1 fJ/Bit Capacitive-Latch True Random Number Generator Featuring Both Autozeroed Inverter Mismatch and Accelerated Evaluation 150 150
Author(s): Woojin Lee, Changmin Sim, Changjoo Kim, Jinwoo Jeon, Hyundo Jung, Taihyun Kim, Chulwoo Kim

Abstract:

This work presents a capacitive-latch (C-latch) true random number generator (TRNG) that achieves both inverter mismatch autozeroing and accelerated evaluation by utilizing coupling capacitors. The proposed C-latch TRNG samples the mismatch between inverter equalization voltages through coupling capacitors during the equalization phase, effectively autozeroing inverter mismatch and enabling high-entropy raw …

Published in: IEEE Solid-State Circuits Letters
Page(s): 265 – 268
Year of Publication: 2025
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3608187
Publisher: IEEE

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