Degradation

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A Modular Ring-Oscillator Array Chip for Accurate Stress Testing of CMOS Aging Mechanisms

A Modular Ring-Oscillator Array Chip for Accurate Stress Testing of CMOS Aging Mechanisms 150 150
Author(s): Javier Diaz-Fortuny, Erik Bury, Robin Degraeve, Ben Kaczer

Abstract:

Ring-oscillator (RO) circuits have historically been used to characterize the performance of CMOS technologies, as they can easily expose both process variability and aging through a straightforward circuit structure. ROs are widely employed to study degradation mechanisms such as bias temperature instability (BTI) and hot carrier degradation (HCD), which progressively …

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1 – 13
Year of Publication: 2026
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2026.3653472
Publisher: IEEE

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A Broadband and Compact GaN Millimeter-Wave MMIC SPDT Switch Using Modified π-Networks

A Broadband and Compact GaN Millimeter-Wave MMIC SPDT Switch Using Modified π-Networks 150 150
Author(s): Chaorong Wang, Quan Pan, Xiaohu Fang

Abstract:

This letter presents a design methodology for broadband and compact millimeter-wave (mm-wave) single-pole double-throw (SPDT) switches targeting the Ku–Ka band. Conventional SPDT switches based on quarter-wavelength transmission line typically occupy significant chip area, while alternative designs utilizing standard $\pi $ -type equivalent circuits often suffer from bandwidth degradation due to …

Published in: IEEE Solid-State Circuits Letters
Page(s): 21 – 24
Year of Publication: 2026
Electronic ISSN: 2573-9603
DOI: 10.1109/LSSC.2025.3646815
Publisher: IEEE

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Impact of Aging, Self-Heating, and Parasitics Effects on NSFET and CFET

Impact of Aging, Self-Heating, and Parasitics Effects on NSFET and CFET 150 150
Author(s): Swati Deshwal, Sufia Shahin, Anirban Kar, Yogesh S. Chauhan, Hussam Amrouch

Abstract:

This work presents a comparative analysis of complementary field-effect transistor (CFET) and nanosheet FET (NSFET) architectures, with a focus on self-heating effects (SHEs), negative bias temperature instability (NBTI), hot carrier degradation (HCD), and the impact of back-end-of-line (BEOL) parasitics on standard cell performance. NBTI degradation is modeled using a framework …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 188 – 196
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3624653
Publisher: IEEE

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A Low-Power Blocker-Tolerant Wideband Receiver With Bias-Tunable Mixer and Effective Switch Resistance Compensation

A Low-Power Blocker-Tolerant Wideband Receiver With Bias-Tunable Mixer and Effective Switch Resistance Compensation 150 150
Author(s): Rundi Wu, Yetong Wang, Ran Hong, Zongle Ma, Kenan Xie, Fanyi Meng, Kaixue Ma, Keping Wang

Abstract:

This article presents a mixer-first blocker-tolerant receiver (RX) with effective switch resistance ( ${R} _{\text {SW}}$ ) compensation and high-Q selectivity. By analyzing the impact of non-ideal 1/N LO duty cycle and effective ${R} _{\text {SW}}$ on mixer-first RX, an effective ${R} _{\text {SW}}$ compensation technique is proposed to mitigate noise figure (…

Published in: IEEE Journal of Solid-State Circuits
Page(s): 1554 – 1569
Year of Publication: 2025
Electronic ISSN: 1558-173X
DOI: 10.1109/JSSC.2025.3529681
Publisher: IEEE

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