IEEE Journal on Exploratory Solid-State Computational Devices and Circuits – Journals

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Reference-Load Sharing Scheme: An Area- and Energy-Efficient Nonvolatile Register Design Using MTJ Devices

Reference-Load Sharing Scheme: An Area- and Energy-Efficient Nonvolatile Register Design Using MTJ Devices 150 150
Author(s): Masanori Natsui, Tomoo Yoshida, Takahiro Hanyu

Abstract:

This article proposes a circuit configuration for an area- and energy-efficient nonvolatile register using magnetic tunnel junction (MTJ) devices, suitable for persistent computation in intermittent computing environments. The proposed configuration, named the reference-load sharing scheme (RLSS), stores 1 bit of information using the resistance of a dedicated MTJ device and a …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 90 – 98
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3611365
Publisher: IEEE

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FIMA: A Scalable Ferroelectric Compute-in-Memory Annealer for Accelerating Boolean Satisfiability

FIMA: A Scalable Ferroelectric Compute-in-Memory Annealer for Accelerating Boolean Satisfiability 150 150
Author(s): Mohammad Khairul Bashar, T. H. Pantha, Z. Li, M. Farasat, S. Datta, V. Narayanan, S. Dutta, N. Shukla

Abstract:

In-memory compute kernels present a promising approach for addressing data-centric workloads. However, their scalability—particularly for computationally intensive tasks solving combinatorial optimization problems such as Boolean satisfiability (SAT), which are inherently difficult to decompose—remains a significant challenge. In this work, we propose a ferroelectric nonvolatile memory (NVM)-based compute-in-memory …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 81 – 89
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3603942
Publisher: IEEE

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Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors

Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors 150 150
Author(s): Wei Zhang, Jianze Wang, Xuanyao Fong

Abstract:

We utilized phase-field simulations to investigate the effects of polar-axis (PA) orientation fluctuations on the extrinsic properties of single ferroelectric (FE) grains, focusing on the coercive electrical field (EC) and the remnant polarization (Pr). The underlying mechanisms through which PA orientation fluctuations influence polarization behavior are studied to gain insights …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 74 – 80
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3586589
Publisher: IEEE

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Reconfigurable Ferroelectric Bandpass Filter With Low-Frequency Noise Analysis for Intracardiac Electrogram Monitoring

Reconfigurable Ferroelectric Bandpass Filter With Low-Frequency Noise Analysis for Intracardiac Electrogram Monitoring 150 150
Author(s): Jianwei Jia, Zhenge Jia, Omkar Phadke, Yiyu Shi, Shimeng Yu

Abstract:

Implantable cardioverter defibrillators (ICDs) provide real-time monitoring and immediate defibrillation for life-threatening arrhythmias. However, the intracardiac electrogram (IEGM) acquisition of ICDs faces stringent constraints, including power consumption, low-frequency noise, and patient-specific physiological variability. This article introduces an ultralow-power, high-resolution, reconfigurable three-stage bandpass filter designed specifically for IEGM, utilizing ferroelectric field-effect …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 67 – 73
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3584711
Publisher: IEEE

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A Passive and Scalable High-Order Neuromorphic Circuit Enabled by Mott Memristors

A Passive and Scalable High-Order Neuromorphic Circuit Enabled by Mott Memristors 150 150
Author(s): Zikang Lin, Xiaohui Wu, Shujing Zhao, Weihua Liu, Xin Li, Li Geng, Chuanyu Han

Abstract:

In this study, VO2 Mott memristors have been successfully fabricated, leading to the proposal of a passive and scalable high-order neural circuit. This circuit consists of two coupled VO2 Mott memristors, two resistors, and three capacitors. The proposed high-order neural circuit demonstrates 11 distinct firing behaviors similar to those of biological …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 60 – 66
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3573709
Publisher: IEEE

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CFET Beyond 3 nm: SRAM Reliability Under Design-Time and Run-Time Variability

CFET Beyond 3 nm: SRAM Reliability Under Design-Time and Run-Time Variability 150 150
Author(s): Sufia Shahin, Swati Deshwal, Anirban Kar, Mahdi Benkhelifa, Yogesh S. Chauhan, Hussam Amrouch

Abstract:

This work investigates the reliability of complementary field-effect transistors (CFETs) by addressing both design-time variability arising from process variations and run-time variability due to temperature and aging effects. A rigorously calibrated TCAD model, validated against experimental CFET data, is employed to quantify the impact of metal gate granularity (MGG)-induced …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 51 – 59
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3568622
Publisher: IEEE

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An Investigation of Minimum Supply Voltage of 5-nm SRAM From 300 K Down to 10 K

An Investigation of Minimum Supply Voltage of 5-nm SRAM From 300 K Down to 10 K 150 150
Author(s): Hafeez Raza, Shivendra Singh Parihar, Yogesh Singh Chauhan, Hussam Amrouch, Avinash Lahgere

Abstract:

In this article, we present a comprehensive study of the impact of cryogenic temperatures on the minimum operating voltage ( $V_{\min }$ ) of 5-nm Fin Field-Effect Transistors (FinFETs)-based Static Random Access Memory (SRAM) cells. To perform the SRAM $V_{\min }$ evaluation, we have measured the FinFETs fabricated using a commercial 5…

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 42 – 50
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3560215
Publisher: IEEE

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Cryogenic Hyperdimensional In-Memory Computing Using Ferroelectric TCAM

Cryogenic Hyperdimensional In-Memory Computing Using Ferroelectric TCAM 150 150
Author(s): Shivendra Singh Parihar, Shubham Kumar, Swetaki Chatterjee, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch

Abstract:

Cryogenic operations of electronics present a significant step forward to achieve huge demand of in-memory computing (IMC) for high-performance computing, quantum computing, and military applications. Ferroelectric (FE) is a promising candidate to develop the complementary metal oxide semiconductor (CMOS)-compatible nonvolatile memories. Hence, in this work, we investigate the effectiveness …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 34 – 41
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3547797
Publisher: IEEE

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Device Nonideality-Aware Compute-in-Memory Array Architecting: Direct Voltage Sensing, I–V Symmetric Bitcell, and Padding Array

Device Nonideality-Aware Compute-in-Memory Array Architecting: Direct Voltage Sensing, I–V Symmetric Bitcell, and Padding Array 150 150
Author(s): Jianzi Jin, Shifan Gao, Cimang Lu, Xiang Qiu, Yi Zhao

Abstract:

A voltage sensing compute-in-memory (CIM) architecture has been designed to improve the analog computing accuracy, and a chip on 90-nm flash platform has been successfully fabricated, with the bidirectional operation enabled by the symmetric bitcell structure. By padding the weight sum to a global value for all bit lines (BLs), …

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Page(s): 19 – 24
Year of Publication: 2025
Electronic ISSN: 2329-9231
DOI: 10.1109/JXCDC.2025.3539470
Publisher: IEEE

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